Self-interference fluorescent emission microscopy -5nm vertical resolution

A. K. Swan*, M. S. Ünlü, Y. Tong, B. B. Goldberg, L. Moiseev, C. Cantor

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

A new method of fluorescence imaging which yielded an unprecedented vertical resolution was presented. Unique spectral signature of the fluorescent emission intensity above a reflecting surface was used instead of spatial variation method. Clear distinction was made between markers bound directly to the substrate from those bound on top of a single layer of streptavidin using better than 5-nm vertical resolution.

Original languageEnglish (US)
Title of host publicationConference on Lasers and Electro-Optics, 2001. CLEO 01. Technical Digest
Pages360-361
Number of pages2
StatePublished - Oct 8 2001
EventConference on Lasers and Electro-Optics (CLEO) - Baltimore, MD, United States
Duration: May 6 2001May 11 2001

Other

OtherConference on Lasers and Electro-Optics (CLEO)
CountryUnited States
CityBaltimore, MD
Period5/6/015/11/01

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

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