Self-interference fluorescent emission microscopy -5nm vertical resolution

A. K. Swan*, M. S. Ünlü, Y. Tong, B. B. Goldberg, L. Moiseev, C. Cantor

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Fingerprint Dive into the research topics of 'Self-interference fluorescent emission microscopy -5nm vertical resolution'. Together they form a unique fingerprint.

Engineering & Materials Science