TY - GEN
T1 - Sequential Logic Encryption against Model Checking Attack
AU - Rezaei, Amin
AU - Zhou, Hai
N1 - Publisher Copyright:
© 2021 EDAA.
PY - 2021/2/1
Y1 - 2021/2/1
N2 - Due to high IC design costs and emergence of countless untrusted foundries, logic encryption has been taken into consideration more than ever. In state-of-the-art logic encryption works, a lot of performance is sold to guarantee security against both the SAT-based and the removal attacks. However, the SAT-based attack cannot decrypt the sequential circuits if the scan chain is protected or if the unreachable states encryption is adopted. Instead, these security schemes can be defeated by the model checking attack that searches iteratively for different input sequences to put the activated IC to the desired reachable state. In this paper, we propose a practical logic encryption approach to defend against the model checking attack on sequential circuits. The robustness of the proposed approach is demonstrated by experiments on around fifty benchmarks.
AB - Due to high IC design costs and emergence of countless untrusted foundries, logic encryption has been taken into consideration more than ever. In state-of-the-art logic encryption works, a lot of performance is sold to guarantee security against both the SAT-based and the removal attacks. However, the SAT-based attack cannot decrypt the sequential circuits if the scan chain is protected or if the unreachable states encryption is adopted. Instead, these security schemes can be defeated by the model checking attack that searches iteratively for different input sequences to put the activated IC to the desired reachable state. In this paper, we propose a practical logic encryption approach to defend against the model checking attack on sequential circuits. The robustness of the proposed approach is demonstrated by experiments on around fifty benchmarks.
KW - Model Checking Attack
KW - Sequential Encryption
KW - Sequential Logic Encryption
KW - Sequential Transformation
UR - http://www.scopus.com/inward/record.url?scp=85111034114&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85111034114&partnerID=8YFLogxK
U2 - 10.23919/DATE51398.2021.9474002
DO - 10.23919/DATE51398.2021.9474002
M3 - Conference contribution
AN - SCOPUS:85111034114
T3 - Proceedings -Design, Automation and Test in Europe, DATE
SP - 1178
EP - 1181
BT - Proceedings of the 2021 Design, Automation and Test in Europe, DATE 2021
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2021 Design, Automation and Test in Europe Conference and Exhibition, DATE 2021
Y2 - 1 February 2021 through 5 February 2021
ER -