Abstract
A novel nano-injection based imaging sensor is presented towards demanding applications in telecommunications, biophotonics, optical tomography, explosives detection and non-destructive material evaluation. The sensor can provide low noise levels concurrently with strong internal amplification, which results in a significant increase in the signal-to-noise levels compared to existing short-wave infrared imagers. The imager arrays are 320-by-256 pixels, with a pixel pitch of 30 μm. Post-hybridization, the imager test pixels shows internal amplification exceeding 2,000 electrons/photon with little excess noise (F∼1.5) even at high amplification values. The imager shows a high signal to noise ratio at high frame rates and short integration times. Furthermore, the nano-injection imaging sensor shows significant sensitivity improvement over a high-end commercial short-wave infrared camera at similar settings, which highlights the benefits of implementing nano-injection process in imaging sensors.
Original language | English (US) |
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Title of host publication | IEEE Sensors 2010 Conference, SENSORS 2010 |
Pages | 128-131 |
Number of pages | 4 |
DOIs | |
State | Published - Dec 1 2010 |
Event | 9th IEEE Sensors Conference 2010, SENSORS 2010 - Waikoloa, HI, United States Duration: Nov 1 2010 → Nov 4 2010 |
Other
Other | 9th IEEE Sensors Conference 2010, SENSORS 2010 |
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Country/Territory | United States |
City | Waikoloa, HI |
Period | 11/1/10 → 11/4/10 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering