Si(111)-(5×2)Au structure from off-axis high-resolution transmission electron microscopy

R. Plass*, Laurence Marks

*Corresponding author for this work

Research output: Contribution to conferencePaper

Abstract

The interface between a gold submonolayer and its silicon (111) substrate was investigated using high resolution transmission electron microscopy and digital image restoration in combination with more conventional bright-field, dark-field imaging and diffraction techniques. Results revealed that two gold atoms have a spacing which is near coincident with the silicon 1×1 spacing.

Original languageEnglish (US)
Pages762-763
Number of pages2
StatePublished - Dec 1 1994
EventProceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA
Duration: Jul 31 1994Aug 5 1994

Other

OtherProceedings of the 52nd Annual Meeting of the Microscopy Society of America
CityNew Orleans, LA, USA
Period7/31/948/5/94

ASJC Scopus subject areas

  • Engineering(all)

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    Plass, R., & Marks, L. (1994). Si(111)-(5×2)Au structure from off-axis high-resolution transmission electron microscopy. 762-763. Paper presented at Proceedings of the 52nd Annual Meeting of the Microscopy Society of America, New Orleans, LA, USA, .