Simultaneous ultrafast transmission and reflection of nanometer-thick Ti3C2Tx MXene films in the visible and near-infrared: Implications for energy storage, electromagnetic shielding, and laser systems

David B. Lioi*, W. Joshua Kennedy, Peter R. Stevenson, Bryan T. Seymour, Gregory Neher, Richard D. Schaller, David J. Gosztola, Richard A. Vaia, Jonathon P. Vernon

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

Unambiguous determination of the optical dynamics in MXenes is necessary for their reliable development into applications such as EMI shielding, energy storage, and laser systems. Here, simultaneous ultrafast transmission and reflection (SUTR) is used to determine the temporal change in refractory index (n) and extinction coefficient (k) of Ti3C2Tx from 450 to 1300 nm which is dominated by intraflake mechanisms. We assign the dynamics for wavelengths below 600 nm with interband transitions, while those at 800 nm are assigned to a plasmon resonance. The response from 1000 to 1300 nm shows changes in index of refraction with no changes in extinction coefficient, consistent with free carriers.

Original languageEnglish (US)
Pages (from-to)9604-9609
Number of pages6
JournalACS Applied Nano Materials
Volume3
Issue number10
DOIs
StatePublished - Oct 23 2020

Keywords

  • Ellipsometry
  • MXenes
  • Simultaneous ultrafast transmission and reflection
  • Surface plasmon
  • TiC

ASJC Scopus subject areas

  • Materials Science(all)

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