Simultaneous X-ray fluorescence and scanning X-ray diffraction microscopy at the Australian Synchrotron XFM beamline

Michael W M Jones; Nicholas W. Phillips; Grant A. Van Riessen; Brian Abbey; David J. Vine; Youssef S G Nashed; Stephen T. Mudie; Nader Afshar; Robin Kirkham; Bo Chen; Eugeniu Balaur; Martin D. De Jonge

doi:10.1107/S1600577516011917

Simultaneous X-ray fluorescence and scanning X-ray diffraction microscopy at the Australian Synchrotron XFM beamline

Michael W M Jones, Nicholas W. Phillips, Grant A. Van Riessen, Brian Abbey, David J. Vine, Youssef S G Nashed, Stephen T. Mudie, Nader Afshar, Robin Kirkham, Bo Chen, Eugeniu Balaur, Martin D. De Jonge

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

18 Scopus citations

Abstract

Owing to its extreme sensitivity, quantitative mapping of elemental distributions via X-ray fluorescence microscopy (XFM) has become a key microanalytical technique. The recent realisation of scanning X-ray diffraction microscopy (SXDM) meanwhile provides an avenue for quantitative super-resolved ultra-structural visualization. The similarity of their experimental geometries indicates excellent prospects for simultaneous acquisition. Here, in both step- and fly-scanning modes, robust, simultaneous XFM-SXDM is demonstrated.

Original language	English (US)
Pages (from-to)	1151-1157
Number of pages	7
Journal	Journal of Synchrotron Radiation
Volume	23
DOIs	https://doi.org/10.1107/S1600577516011917
State	Published - 2016

Keywords

X-ray fluorescence
ptychography
scanning X-ray diffraction microscopy

ASJC Scopus subject areas

Nuclear and High Energy Physics
Instrumentation
Radiation

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10.1107/S1600577516011917

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Jones, M. W. M., Phillips, N. W., Van Riessen, G. A., Abbey, B., Vine, D. J., Nashed, Y. S. G., Mudie, S. T., Afshar, N., Kirkham, R., Chen, B., Balaur, E., & De Jonge, M. D. (2016). Simultaneous X-ray fluorescence and scanning X-ray diffraction microscopy at the Australian Synchrotron XFM beamline. Journal of Synchrotron Radiation, 23, 1151-1157. https://doi.org/10.1107/S1600577516011917

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title = "Simultaneous X-ray fluorescence and scanning X-ray diffraction microscopy at the Australian Synchrotron XFM beamline",

abstract = "Owing to its extreme sensitivity, quantitative mapping of elemental distributions via X-ray fluorescence microscopy (XFM) has become a key microanalytical technique. The recent realisation of scanning X-ray diffraction microscopy (SXDM) meanwhile provides an avenue for quantitative super-resolved ultra-structural visualization. The similarity of their experimental geometries indicates excellent prospects for simultaneous acquisition. Here, in both step- and fly-scanning modes, robust, simultaneous XFM-SXDM is demonstrated.",

keywords = "X-ray fluorescence, ptychography, scanning X-ray diffraction microscopy",

author = "Jones, {Michael W M} and Phillips, {Nicholas W.} and {Van Riessen}, {Grant A.} and Brian Abbey and Vine, {David J.} and Nashed, {Youssef S G} and Mudie, {Stephen T.} and Nader Afshar and Robin Kirkham and Bo Chen and Eugeniu Balaur and {De Jonge}, {Martin D.}",

note = "Publisher Copyright: {\textcopyright} 2016 International Union of Crystallography.",

year = "2016",

doi = "10.1107/S1600577516011917",

language = "English (US)",

volume = "23",

pages = "1151--1157",

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T1 - Simultaneous X-ray fluorescence and scanning X-ray diffraction microscopy at the Australian Synchrotron XFM beamline

AU - Jones, Michael W M

AU - Phillips, Nicholas W.

AU - Van Riessen, Grant A.

AU - Abbey, Brian

AU - Vine, David J.

AU - Nashed, Youssef S G

AU - Mudie, Stephen T.

AU - Afshar, Nader

AU - Kirkham, Robin

AU - Chen, Bo

AU - Balaur, Eugeniu

AU - De Jonge, Martin D.

PY - 2016

Y1 - 2016

N2 - Owing to its extreme sensitivity, quantitative mapping of elemental distributions via X-ray fluorescence microscopy (XFM) has become a key microanalytical technique. The recent realisation of scanning X-ray diffraction microscopy (SXDM) meanwhile provides an avenue for quantitative super-resolved ultra-structural visualization. The similarity of their experimental geometries indicates excellent prospects for simultaneous acquisition. Here, in both step- and fly-scanning modes, robust, simultaneous XFM-SXDM is demonstrated.

AB - Owing to its extreme sensitivity, quantitative mapping of elemental distributions via X-ray fluorescence microscopy (XFM) has become a key microanalytical technique. The recent realisation of scanning X-ray diffraction microscopy (SXDM) meanwhile provides an avenue for quantitative super-resolved ultra-structural visualization. The similarity of their experimental geometries indicates excellent prospects for simultaneous acquisition. Here, in both step- and fly-scanning modes, robust, simultaneous XFM-SXDM is demonstrated.

KW - X-ray fluorescence

KW - ptychography

KW - scanning X-ray diffraction microscopy

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Simultaneous X-ray fluorescence and scanning X-ray diffraction microscopy at the Australian Synchrotron XFM beamline

Abstract

Keywords

ASJC Scopus subject areas

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