Simultaneous X-ray fluorescence and scanning X-ray diffraction microscopy at the Australian Synchrotron XFM beamline

Michael W M Jones, Nicholas W. Phillips, Grant A. Van Riessen, Brian Abbey, David J. Vine, Youssef S G Nashed, Stephen T. Mudie, Nader Afshar, Robin Kirkham, Bo Chen, Eugeniu Balaur, Martin D. De Jonge

Research output: Contribution to journalArticle

13 Scopus citations

Abstract

Owing to its extreme sensitivity, quantitative mapping of elemental distributions via X-ray fluorescence microscopy (XFM) has become a key microanalytical technique. The recent realisation of scanning X-ray diffraction microscopy (SXDM) meanwhile provides an avenue for quantitative super-resolved ultra-structural visualization. The similarity of their experimental geometries indicates excellent prospects for simultaneous acquisition. Here, in both step- and fly-scanning modes, robust, simultaneous XFM-SXDM is demonstrated.

Original languageEnglish (US)
Pages (from-to)1151-1157
Number of pages7
JournalJournal of Synchrotron Radiation
Volume23
DOIs
StatePublished - 2016

Keywords

  • X-ray fluorescence
  • ptychography
  • scanning X-ray diffraction microscopy

ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Instrumentation

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    Jones, M. W. M., Phillips, N. W., Van Riessen, G. A., Abbey, B., Vine, D. J., Nashed, Y. S. G., Mudie, S. T., Afshar, N., Kirkham, R., Chen, B., Balaur, E., & De Jonge, M. D. (2016). Simultaneous X-ray fluorescence and scanning X-ray diffraction microscopy at the Australian Synchrotron XFM beamline. Journal of Synchrotron Radiation, 23, 1151-1157. https://doi.org/10.1107/S1600577516011917