Single-element elliptical hard x-ray micro-optics

Kenneth Evans-Lutterodt*, James M. Ablett, Aaron Stein, Chi Chang Kao, Donald M. Tennant, Fred Klemens, Ashley Taylor, Chris Jacobsen, Peter L. Gammel, Harold Huggins, Scott Ustin, Greg Bogart, Leo Ocola

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

89 Scopus citations

Abstract

Using micro-fabrication techniques, we have manufactured a single element kinoform lens in single-crystal silicon with an elliptical profile for 12.398 keV (1Å) x-rays. By fabricating a lens that is optimized at fixed wavelengths, absorption in the lens material can be significantly reduced by removing 2π phase-shifting regions. This permits short focal length devices to be fabricated with small radii of curvatures at the lens apex. This feature allows one to obtain a high demagnification of a finite synchrotron electron source size. The reduced absorption loss also enables optics with a larger aperture, and hence improved resolution for focussing and imaging applications. Our first trial of these lenses has resulted in a one micron line focus (fwhm) at the National Synchrotron Light Source X13B beamline.

Original languageEnglish (US)
Pages (from-to)919-926
Number of pages8
JournalOptics Express
Volume11
Issue number8
DOIs
StatePublished - Apr 2003

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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