Size dependence of the Kondo resistivity in AuFe wires

V. Chandrasekhar*, P. Santhanam, N. A. Penebre, R. A. Webb, H. Vloeberghs, C. Van Haesendonck, Y. Bruynseraede

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

We have measured the temperature and magnetic field dependence of the low temperature resistivity of Au wires with dilute (∼50 ppm) Fe impurities as a function of wire width. In contrast to previous experiments, we find an increase in slope of the temperature dependent resistivity Δρ{variant}(T) as the wire width is decreased. A systematic trend is also evident in the field dependent resistivity Δρ{variant}(H). We also find an unusual scaling relation between Δρ{variant}(T) and Δρ{variant}(H) in our wider samples.

Original languageEnglish (US)
Pages (from-to)1053-1054
Number of pages2
JournalPhysica B: Physics of Condensed Matter
Volume194-196
Issue numberPART 1
DOIs
StatePublished - Feb 2 1994

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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