Original language | English (US) |
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Publisher | SPIE |
Number of pages | 202 |
Volume | 9763 |
ISBN (Print) | 978-1628419986 |
State | Published - 2016 |
Slow Light, Fast Light, and Opto-Atomic Precision Metrology IX: Proceedings of SPIE Photonics West 2016
Selim M Shahriar (Editor), Jacob Scheuer (Editor)
Research output: Book/Report › Book