| Original language | English (US) |
|---|---|
| Publisher | SPIE |
| Number of pages | 180 |
| Volume | 9378 |
| ISBN (Print) | 978-1628414684 |
| State | Published - 2015 |
Slow Light, Fast Light, and Opto-Atomic Precision Metrology VIII: Proceedings of SPIE Photonics West 2015
Selim M Shahriar (Editor), Jacob Scheuer (Editor)
Research output: Book/Report › Book