| Original language | English (US) |
|---|---|
| Publisher | SPIE |
| Number of pages | 184 |
| Volume | 10119 |
| ISBN (Print) | 978-1510606791 |
| State | Published - 2017 |
Slow Light, Fast Light, and Opto-Atomic Precision Metrology X: Proceedings of SPIE Photonics West 2017
Selim M Shahriar (Editor), Jacob Scheuer (Editor)
Research output: Book/Report › Book