Smoother shank profile for atom probe specimens prepared by the multi-step focused ion beam milling

S. Pinitsoontorn; A. Cerezo; A. K. Petford-Long

doi:10.1109/IVNC.2006.335327

Smoother shank profile for atom probe specimens prepared by the multi-step focused ion beam milling

S. Pinitsoontorn^*, A. Cerezo, A. K. Petford-Long

^*Corresponding author for this work

Materials Science and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium
Pages	525-526
Number of pages	2
DOIs	https://doi.org/10.1109/IVNC.2006.335327
State	Published - 2006
Event	19th International Vacuum Nanoelecronics Conference and 50th International Field Emission Symposium, IVNC and IFES 2006 - Guilin, China Duration: Jul 17 2006 → Jul 20 2006

Publication series

Name	IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium

Other

Other	19th International Vacuum Nanoelecronics Conference and 50th International Field Emission Symposium, IVNC and IFES 2006
Country/Territory	China
City	Guilin
Period	7/17/06 → 7/20/06

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/IVNC.2006.335327

Cite this

Pinitsoontorn, S., Cerezo, A., & Petford-Long, A. K. (2006). Smoother shank profile for atom probe specimens prepared by the multi-step focused ion beam milling. In IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium (pp. 525-526). Article 4134691 (IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium). https://doi.org/10.1109/IVNC.2006.335327

Pinitsoontorn, S. ; Cerezo, A. ; Petford-Long, A. K. / Smoother shank profile for atom probe specimens prepared by the multi-step focused ion beam milling. IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium. 2006. pp. 525-526 (IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium).

@inproceedings{445f2f6457e242fb8b6a3876daf14aa0,

title = "Smoother shank profile for atom probe specimens prepared by the multi-step focused ion beam milling",

author = "S. Pinitsoontorn and A. Cerezo and Petford-Long, {A. K.}",

year = "2006",

doi = "10.1109/IVNC.2006.335327",

language = "English (US)",

isbn = "1424404010",

series = "IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium",

pages = "525--526",

booktitle = "IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium",

note = "19th International Vacuum Nanoelecronics Conference and 50th International Field Emission Symposium, IVNC and IFES 2006 ; Conference date: 17-07-2006 Through 20-07-2006",

}

Pinitsoontorn, S, Cerezo, A & Petford-Long, AK 2006, Smoother shank profile for atom probe specimens prepared by the multi-step focused ion beam milling. in IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium., 4134691, IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium, pp. 525-526, 19th International Vacuum Nanoelecronics Conference and 50th International Field Emission Symposium, IVNC and IFES 2006, Guilin, China, 7/17/06. https://doi.org/10.1109/IVNC.2006.335327

Smoother shank profile for atom probe specimens prepared by the multi-step focused ion beam milling. / Pinitsoontorn, S.; Cerezo, A.; Petford-Long, A. K.
IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium. 2006. p. 525-526 4134691 (IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Smoother shank profile for atom probe specimens prepared by the multi-step focused ion beam milling

AU - Pinitsoontorn, S.

AU - Cerezo, A.

AU - Petford-Long, A. K.

PY - 2006

Y1 - 2006

UR - http://www.scopus.com/inward/record.url?scp=48649110260&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=48649110260&partnerID=8YFLogxK

U2 - 10.1109/IVNC.2006.335327

DO - 10.1109/IVNC.2006.335327

M3 - Conference contribution

AN - SCOPUS:48649110260

SN - 1424404010

SN - 9781424404018

T3 - IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium

SP - 525

EP - 526

BT - IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium

T2 - 19th International Vacuum Nanoelecronics Conference and 50th International Field Emission Symposium, IVNC and IFES 2006

Y2 - 17 July 2006 through 20 July 2006

ER -

Pinitsoontorn S, Cerezo A, Petford-Long AK. Smoother shank profile for atom probe specimens prepared by the multi-step focused ion beam milling. In IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium. 2006. p. 525-526. 4134691. (IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium). doi: 10.1109/IVNC.2006.335327

Smoother shank profile for atom probe specimens prepared by the multi-step focused ion beam milling

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