Smoother shank profile for atom probe specimens prepared by the multi-step focused ion beam milling

S. Pinitsoontorn*, A. Cerezo, A. K. Petford-Long

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publicationIVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium
Pages525-526
Number of pages2
DOIs
StatePublished - Dec 1 2006
Event19th International Vacuum Nanoelecronics Conference and 50th International Field Emission Symposium, IVNC and IFES 2006 - Guilin, China
Duration: Jul 17 2006Jul 20 2006

Other

Other19th International Vacuum Nanoelecronics Conference and 50th International Field Emission Symposium, IVNC and IFES 2006
CountryChina
CityGuilin
Period7/17/067/20/06

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Pinitsoontorn, S., Cerezo, A., & Petford-Long, A. K. (2006). Smoother shank profile for atom probe specimens prepared by the multi-step focused ion beam milling. In IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium (pp. 525-526). [4134691] https://doi.org/10.1109/IVNC.2006.335327