Solute-atom segregation at internal interfaces on an atomic scale: atom-probe experiments and computer simulations

D. N. Seidman

doi:10.1016/0921-5093(91)90318-H

Solute-atom segregation at internal interfaces on an atomic scale: atom-probe experiments and computer simulations

D. N. Seidman^*

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

30 Scopus citations

Abstract

This paper addresses fundamental questions concerning the determination of the chemical compositions of internal interfaces (grain boundaries)-in single-phase f.c.c. or b.c.c. binary alloys-and the relationships of the solute enhancement factor at a grain boundary to its structure. This goal is achieved utilizing three principal techniques: (i) atom-probe field-ion microscopy; (ii) transmission electron microscopy; and (iii) Monte Carlo computer simulations that utilize embedded atom method potentials for f.c.c. alloys. Atom-probe field-ion microscopy is used to determine the chemical composition of an interface, and transmission electron microscopy is employed to determine its five macroscopic degrees of freedom. The Monte Carlo simulations employ the Metropolis et al. algorithm to simulate segregation in the Pt(Au) and Pt(Ni) systems. Detailed experimental and computer simultation results are presented for grain boundaries in Pt(Au), Pt(Ni) and W(Re) primary solid-solution alloys.

Original language	English (US)
Pages (from-to)	57-67
Number of pages	11
Journal	Materials Science and Engineering A
Volume	137
Issue number	C
DOIs	https://doi.org/10.1016/0921-5093(91)90318-H
State	Published - May 15 1991

ASJC Scopus subject areas

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

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title = "Solute-atom segregation at internal interfaces on an atomic scale: atom-probe experiments and computer simulations",

abstract = "This paper addresses fundamental questions concerning the determination of the chemical compositions of internal interfaces (grain boundaries)-in single-phase f.c.c. or b.c.c. binary alloys-and the relationships of the solute enhancement factor at a grain boundary to its structure. This goal is achieved utilizing three principal techniques: (i) atom-probe field-ion microscopy; (ii) transmission electron microscopy; and (iii) Monte Carlo computer simulations that utilize embedded atom method potentials for f.c.c. alloys. Atom-probe field-ion microscopy is used to determine the chemical composition of an interface, and transmission electron microscopy is employed to determine its five macroscopic degrees of freedom. The Monte Carlo simulations employ the Metropolis et al. algorithm to simulate segregation in the Pt(Au) and Pt(Ni) systems. Detailed experimental and computer simultation results are presented for grain boundaries in Pt(Au), Pt(Ni) and W(Re) primary solid-solution alloys.",

author = "Seidman, {D. N.}",

note = "Funding Information: This research is supported by the National Science Foundation through Grant No. DMR-8819074 (Dr. B. MacDonald, grant officer). Additional support was received through the use of the central facilities of the National-Science-Foundation-funded Materials Research Center at Northwestern University. The Monte Carlo simulations were performed at the National-Science-Foundation-funded National Center for Supercomputing Applications at the University of Illinois at Urbana-Champaign, IL. I wish to thank Dr. S. M. Foiles, Dr. J. G. Hu, Dr. Y. Oh and Mr. A. Seki for permission to quote from manuscripts that have been submitted for publication.",

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doi = "10.1016/0921-5093(91)90318-H",

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N2 - This paper addresses fundamental questions concerning the determination of the chemical compositions of internal interfaces (grain boundaries)-in single-phase f.c.c. or b.c.c. binary alloys-and the relationships of the solute enhancement factor at a grain boundary to its structure. This goal is achieved utilizing three principal techniques: (i) atom-probe field-ion microscopy; (ii) transmission electron microscopy; and (iii) Monte Carlo computer simulations that utilize embedded atom method potentials for f.c.c. alloys. Atom-probe field-ion microscopy is used to determine the chemical composition of an interface, and transmission electron microscopy is employed to determine its five macroscopic degrees of freedom. The Monte Carlo simulations employ the Metropolis et al. algorithm to simulate segregation in the Pt(Au) and Pt(Ni) systems. Detailed experimental and computer simultation results are presented for grain boundaries in Pt(Au), Pt(Ni) and W(Re) primary solid-solution alloys.

AB - This paper addresses fundamental questions concerning the determination of the chemical compositions of internal interfaces (grain boundaries)-in single-phase f.c.c. or b.c.c. binary alloys-and the relationships of the solute enhancement factor at a grain boundary to its structure. This goal is achieved utilizing three principal techniques: (i) atom-probe field-ion microscopy; (ii) transmission electron microscopy; and (iii) Monte Carlo computer simulations that utilize embedded atom method potentials for f.c.c. alloys. Atom-probe field-ion microscopy is used to determine the chemical composition of an interface, and transmission electron microscopy is employed to determine its five macroscopic degrees of freedom. The Monte Carlo simulations employ the Metropolis et al. algorithm to simulate segregation in the Pt(Au) and Pt(Ni) systems. Detailed experimental and computer simultation results are presented for grain boundaries in Pt(Au), Pt(Ni) and W(Re) primary solid-solution alloys.

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Solute-atom segregation at internal interfaces on an atomic scale: atom-probe experiments and computer simulations

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