Solute-atom segregation at internal interfaces on an atomic scale

atom-probe experiments and computer simulations

David N Seidman*

*Corresponding author for this work

Research output: Contribution to journalArticle

18 Citations (Scopus)

Abstract

This paper addresses fundamental questions concerning the determination of the chemical compositions of internal interfaces (grain boundaries)-in single-phase f.c.c. or b.c.c. binary alloys-and the relationships of the solute enhancement factor at a grain boundary to its structure. This goal is achieved utilizing three principal techniques: (i) atom-probe field-ion microscopy; (ii) transmission electron microscopy; and (iii) Monte Carlo computer simulations that utilize embedded atom method potentials for f.c.c. alloys. Atom-probe field-ion microscopy is used to determine the chemical composition of an interface, and transmission electron microscopy is employed to determine its five macroscopic degrees of freedom. The Monte Carlo simulations employ the Metropolis et al. algorithm to simulate segregation in the Pt(Au) and Pt(Ni) systems. Detailed experimental and computer simultation results are presented for grain boundaries in Pt(Au), Pt(Ni) and W(Re) primary solid-solution alloys.

Original languageEnglish (US)
Pages (from-to)57-67
Number of pages11
JournalMaterials Science and Engineering A
Volume137
Issue numberC
DOIs
StatePublished - May 15 1991

Fingerprint

solutes
Grain boundaries
grain boundaries
computerized simulation
Atoms
probes
Microscopic examination
Computer simulation
chemical composition
Ions
Transmission electron microscopy
microscopy
atoms
transmission electron microscopy
embedded atom method
simulation
Experiments
Binary alloys
binary alloys
Chemical analysis

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

@article{2603279698b045e8a575609ca823c452,
title = "Solute-atom segregation at internal interfaces on an atomic scale: atom-probe experiments and computer simulations",
abstract = "This paper addresses fundamental questions concerning the determination of the chemical compositions of internal interfaces (grain boundaries)-in single-phase f.c.c. or b.c.c. binary alloys-and the relationships of the solute enhancement factor at a grain boundary to its structure. This goal is achieved utilizing three principal techniques: (i) atom-probe field-ion microscopy; (ii) transmission electron microscopy; and (iii) Monte Carlo computer simulations that utilize embedded atom method potentials for f.c.c. alloys. Atom-probe field-ion microscopy is used to determine the chemical composition of an interface, and transmission electron microscopy is employed to determine its five macroscopic degrees of freedom. The Monte Carlo simulations employ the Metropolis et al. algorithm to simulate segregation in the Pt(Au) and Pt(Ni) systems. Detailed experimental and computer simultation results are presented for grain boundaries in Pt(Au), Pt(Ni) and W(Re) primary solid-solution alloys.",
author = "Seidman, {David N}",
year = "1991",
month = "5",
day = "15",
doi = "10.1016/0921-5093(91)90318-H",
language = "English (US)",
volume = "137",
pages = "57--67",
journal = "Materials Science & Engineering A: Structural Materials: Properties, Microstructure and Processing",
issn = "0921-5093",
publisher = "Elsevier BV",
number = "C",

}

TY - JOUR

T1 - Solute-atom segregation at internal interfaces on an atomic scale

T2 - atom-probe experiments and computer simulations

AU - Seidman, David N

PY - 1991/5/15

Y1 - 1991/5/15

N2 - This paper addresses fundamental questions concerning the determination of the chemical compositions of internal interfaces (grain boundaries)-in single-phase f.c.c. or b.c.c. binary alloys-and the relationships of the solute enhancement factor at a grain boundary to its structure. This goal is achieved utilizing three principal techniques: (i) atom-probe field-ion microscopy; (ii) transmission electron microscopy; and (iii) Monte Carlo computer simulations that utilize embedded atom method potentials for f.c.c. alloys. Atom-probe field-ion microscopy is used to determine the chemical composition of an interface, and transmission electron microscopy is employed to determine its five macroscopic degrees of freedom. The Monte Carlo simulations employ the Metropolis et al. algorithm to simulate segregation in the Pt(Au) and Pt(Ni) systems. Detailed experimental and computer simultation results are presented for grain boundaries in Pt(Au), Pt(Ni) and W(Re) primary solid-solution alloys.

AB - This paper addresses fundamental questions concerning the determination of the chemical compositions of internal interfaces (grain boundaries)-in single-phase f.c.c. or b.c.c. binary alloys-and the relationships of the solute enhancement factor at a grain boundary to its structure. This goal is achieved utilizing three principal techniques: (i) atom-probe field-ion microscopy; (ii) transmission electron microscopy; and (iii) Monte Carlo computer simulations that utilize embedded atom method potentials for f.c.c. alloys. Atom-probe field-ion microscopy is used to determine the chemical composition of an interface, and transmission electron microscopy is employed to determine its five macroscopic degrees of freedom. The Monte Carlo simulations employ the Metropolis et al. algorithm to simulate segregation in the Pt(Au) and Pt(Ni) systems. Detailed experimental and computer simultation results are presented for grain boundaries in Pt(Au), Pt(Ni) and W(Re) primary solid-solution alloys.

UR - http://www.scopus.com/inward/record.url?scp=0026155613&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0026155613&partnerID=8YFLogxK

U2 - 10.1016/0921-5093(91)90318-H

DO - 10.1016/0921-5093(91)90318-H

M3 - Article

VL - 137

SP - 57

EP - 67

JO - Materials Science & Engineering A: Structural Materials: Properties, Microstructure and Processing

JF - Materials Science & Engineering A: Structural Materials: Properties, Microstructure and Processing

SN - 0921-5093

IS - C

ER -