A conductive atomic force microscopy (cAFM) technique, atomic force photovoltaic microscopy (AFPM), has been developed to characterize spatially localized inhomogeneities in organic photovoltaic (OPV) devices. In AFPM, a biased cAFM probe is raster scanned over an array of illuminated solar cells, simultaneously generating topographic and photocurrent maps. As proof of principle, AFPM is used to characterize 7.5×7.5 μ m2 poly(3-hexylthiophene):[6,6]-phenyl- C61 -butyric acid methyl ester OPVs, revealing substantial device to device and temporal variations in the short-circuit current. The flexibility of AFPM suggests applicability to nanoscale characterization of a wide range of optoelectronically active materials and devices.
|Original language||English (US)|
|Journal||Applied Physics Letters|
|State||Published - 2008|
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)