Spatially resolved photocurrent mapping of operating organic photovoltaic devices using atomic force photovoltaic microscopy

B. J. Leever; M. F. Durstock; M. D. Irwin; A. W. Hains; T. J. Marks; L. S.C. Pingree; M. C. Hersam

doi:10.1063/1.2830695

Spatially resolved photocurrent mapping of operating organic photovoltaic devices using atomic force photovoltaic microscopy

B. J. Leever^*, M. F. Durstock, M. D. Irwin, A. W. Hains, T. J. Marks, L. S.C. Pingree, M. C. Hersam

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

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Abstract

A conductive atomic force microscopy (cAFM) technique, atomic force photovoltaic microscopy (AFPM), has been developed to characterize spatially localized inhomogeneities in organic photovoltaic (OPV) devices. In AFPM, a biased cAFM probe is raster scanned over an array of illuminated solar cells, simultaneously generating topographic and photocurrent maps. As proof of principle, AFPM is used to characterize 7.5×7.5 μ m2 poly(3-hexylthiophene):[6,6]-phenyl- C61 -butyric acid methyl ester OPVs, revealing substantial device to device and temporal variations in the short-circuit current. The flexibility of AFPM suggests applicability to nanoscale characterization of a wide range of optoelectronically active materials and devices.

Original language	English (US)
Article number	013302
Journal	Applied Physics Letters
Volume	92
Issue number	1
DOIs	https://doi.org/10.1063/1.2830695
State	Published - 2008

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Physics and Astronomy (miscellaneous)

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@article{eed52f6bbe42402ab2e5757655989724,

title = "Spatially resolved photocurrent mapping of operating organic photovoltaic devices using atomic force photovoltaic microscopy",

abstract = "A conductive atomic force microscopy (cAFM) technique, atomic force photovoltaic microscopy (AFPM), has been developed to characterize spatially localized inhomogeneities in organic photovoltaic (OPV) devices. In AFPM, a biased cAFM probe is raster scanned over an array of illuminated solar cells, simultaneously generating topographic and photocurrent maps. As proof of principle, AFPM is used to characterize 7.5×7.5 μ m2 poly(3-hexylthiophene):[6,6]-phenyl- C61 -butyric acid methyl ester OPVs, revealing substantial device to device and temporal variations in the short-circuit current. The flexibility of AFPM suggests applicability to nanoscale characterization of a wide range of optoelectronically active materials and devices.",

author = "Leever, {B. J.} and Durstock, {M. F.} and Irwin, {M. D.} and Hains, {A. W.} and Marks, {T. J.} and Pingree, {L. S.C.} and Hersam, {M. C.}",

note = "Funding Information: This research was supported by BP Solar, DOE (DE-FG02-06ER46320), NSF (ECS-0609064), and AFRL Materials & Manufacturing Directorate. We also acknowledge the use of facilities supported by the Northwestern University MRSEC (NSF DMR-0520513) and thank N. Cortes and M. Russell for many helpful suggestions and comments.",

year = "2008",

doi = "10.1063/1.2830695",

language = "English (US)",

volume = "92",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "1",

}

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T1 - Spatially resolved photocurrent mapping of operating organic photovoltaic devices using atomic force photovoltaic microscopy

AU - Leever, B. J.

AU - Durstock, M. F.

AU - Irwin, M. D.

AU - Hains, A. W.

AU - Marks, T. J.

AU - Pingree, L. S.C.

AU - Hersam, M. C.

N1 - Funding Information: This research was supported by BP Solar, DOE (DE-FG02-06ER46320), NSF (ECS-0609064), and AFRL Materials & Manufacturing Directorate. We also acknowledge the use of facilities supported by the Northwestern University MRSEC (NSF DMR-0520513) and thank N. Cortes and M. Russell for many helpful suggestions and comments.

PY - 2008

Y1 - 2008

N2 - A conductive atomic force microscopy (cAFM) technique, atomic force photovoltaic microscopy (AFPM), has been developed to characterize spatially localized inhomogeneities in organic photovoltaic (OPV) devices. In AFPM, a biased cAFM probe is raster scanned over an array of illuminated solar cells, simultaneously generating topographic and photocurrent maps. As proof of principle, AFPM is used to characterize 7.5×7.5 μ m2 poly(3-hexylthiophene):[6,6]-phenyl- C61 -butyric acid methyl ester OPVs, revealing substantial device to device and temporal variations in the short-circuit current. The flexibility of AFPM suggests applicability to nanoscale characterization of a wide range of optoelectronically active materials and devices.

AB - A conductive atomic force microscopy (cAFM) technique, atomic force photovoltaic microscopy (AFPM), has been developed to characterize spatially localized inhomogeneities in organic photovoltaic (OPV) devices. In AFPM, a biased cAFM probe is raster scanned over an array of illuminated solar cells, simultaneously generating topographic and photocurrent maps. As proof of principle, AFPM is used to characterize 7.5×7.5 μ m2 poly(3-hexylthiophene):[6,6]-phenyl- C61 -butyric acid methyl ester OPVs, revealing substantial device to device and temporal variations in the short-circuit current. The flexibility of AFPM suggests applicability to nanoscale characterization of a wide range of optoelectronically active materials and devices.

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JF - Applied Physics Letters

IS - 1

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ER -

Spatially resolved photocurrent mapping of operating organic photovoltaic devices using atomic force photovoltaic microscopy

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