Spatially resolved photocurrent mapping of operating organic photovoltaic devices using atomic force photovoltaic microscopy

B. J. Leever*, M. F. Durstock, M. D. Irwin, A. W. Hains, T. J. Marks, L. S.C. Pingree, M. C. Hersam

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

27 Scopus citations

Abstract

A conductive atomic force microscopy (cAFM) technique, atomic force photovoltaic microscopy (AFPM), has been developed to characterize spatially localized inhomogeneities in organic photovoltaic (OPV) devices. In AFPM, a biased cAFM probe is raster scanned over an array of illuminated solar cells, simultaneously generating topographic and photocurrent maps. As proof of principle, AFPM is used to characterize 7.5×7.5 μ m2 poly(3-hexylthiophene):[6,6]-phenyl- C61 -butyric acid methyl ester OPVs, revealing substantial device to device and temporal variations in the short-circuit current. The flexibility of AFPM suggests applicability to nanoscale characterization of a wide range of optoelectronically active materials and devices.

Original languageEnglish (US)
Article number013302
JournalApplied Physics Letters
Volume92
Issue number1
DOIs
StatePublished - 2008

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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