Spectral mapping of multimode vertical-cavity surface-emitting lasers by near-field scanning optical microscopy

Kevin J. Knopp; David H. Christensen; Greg Vander Rhodes; Josh M. Pomeroy; Bennett B. Goldberg; M. Selim Unlu

doi:10.1117/12.345431

Spectral mapping of multimode vertical-cavity surface-emitting lasers by near-field scanning optical microscopy

Kevin J. Knopp^*, David H. Christensen, Greg Vander Rhodes, Josh M. Pomeroy, Bennett B. Goldberg, M. Selim Unlu

^*Corresponding author for this work

Physics and Astronomy

Research output: Contribution to journal › Conference article › peer-review

Abstract

We have studied the spatial and spectral characteristics of vertical-cavity surface-emitting laser (VCSEL) emission using near-field scanning optical microscopy (NSOM). We report the multi-transverse-mode characteristics of 15 μm diameter proton-implanted 850 nm devices used in 2 Gbit/s multimode fiber-optic links. Spectrally resolved and integrated intensity scans over a 20×20 μm area were performed. The intensity of each resolvable transverse mode was integrated and its wavelength range false-colored at each scan position. The resulting composite image displays relative intensity and spatial distribution information for each transverse mode. Correlation with the shear force data allows mapping of the optical distributions to topographical features. Lasing filaments were observed at high drive currents. Gain competition among spatially overlapping transverse modes was observed while spatially isolated modes coexisted without competition.

Original language	English (US)
Pages (from-to)	208-216
Number of pages	9
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	3626
DOIs	https://doi.org/10.1117/12.345431
State	Published - 1999
Event	Proceedings of the 1999 Testing, Packaging, Reliability, and Applications of Semiconductor Lasers IV - San Jose, CA, USA Duration: Jan 28 1999 → Jan 28 1999

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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10.1117/12.345431

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@article{6361918bcf7242e796e7905489e59360,

title = "Spectral mapping of multimode vertical-cavity surface-emitting lasers by near-field scanning optical microscopy",

abstract = "We have studied the spatial and spectral characteristics of vertical-cavity surface-emitting laser (VCSEL) emission using near-field scanning optical microscopy (NSOM). We report the multi-transverse-mode characteristics of 15 μm diameter proton-implanted 850 nm devices used in 2 Gbit/s multimode fiber-optic links. Spectrally resolved and integrated intensity scans over a 20×20 μm area were performed. The intensity of each resolvable transverse mode was integrated and its wavelength range false-colored at each scan position. The resulting composite image displays relative intensity and spatial distribution information for each transverse mode. Correlation with the shear force data allows mapping of the optical distributions to topographical features. Lasing filaments were observed at high drive currents. Gain competition among spatially overlapping transverse modes was observed while spatially isolated modes coexisted without competition.",

author = "Knopp, {Kevin J.} and Christensen, {David H.} and {Vander Rhodes}, Greg and Pomeroy, {Josh M.} and Goldberg, {Bennett B.} and Unlu, {M. Selim}",

year = "1999",

doi = "10.1117/12.345431",

language = "English (US)",

volume = "3626",

pages = "208--216",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "Proceedings of the 1999 Testing, Packaging, Reliability, and Applications of Semiconductor Lasers IV ; Conference date: 28-01-1999 Through 28-01-1999",

}

Spectral mapping of multimode vertical-cavity surface-emitting lasers by near-field scanning optical microscopy. / Knopp, Kevin J.; Christensen, David H.; Vander Rhodes, Greg; Pomeroy, Josh M.; Goldberg, Bennett B.; Unlu, M. Selim.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 3626, 1999, p. 208-216.

Research output: Contribution to journal › Conference article › peer-review

TY - JOUR

T1 - Spectral mapping of multimode vertical-cavity surface-emitting lasers by near-field scanning optical microscopy

AU - Knopp, Kevin J.

AU - Christensen, David H.

AU - Vander Rhodes, Greg

AU - Pomeroy, Josh M.

AU - Goldberg, Bennett B.

AU - Unlu, M. Selim

PY - 1999

Y1 - 1999

N2 - We have studied the spatial and spectral characteristics of vertical-cavity surface-emitting laser (VCSEL) emission using near-field scanning optical microscopy (NSOM). We report the multi-transverse-mode characteristics of 15 μm diameter proton-implanted 850 nm devices used in 2 Gbit/s multimode fiber-optic links. Spectrally resolved and integrated intensity scans over a 20×20 μm area were performed. The intensity of each resolvable transverse mode was integrated and its wavelength range false-colored at each scan position. The resulting composite image displays relative intensity and spatial distribution information for each transverse mode. Correlation with the shear force data allows mapping of the optical distributions to topographical features. Lasing filaments were observed at high drive currents. Gain competition among spatially overlapping transverse modes was observed while spatially isolated modes coexisted without competition.

AB - We have studied the spatial and spectral characteristics of vertical-cavity surface-emitting laser (VCSEL) emission using near-field scanning optical microscopy (NSOM). We report the multi-transverse-mode characteristics of 15 μm diameter proton-implanted 850 nm devices used in 2 Gbit/s multimode fiber-optic links. Spectrally resolved and integrated intensity scans over a 20×20 μm area were performed. The intensity of each resolvable transverse mode was integrated and its wavelength range false-colored at each scan position. The resulting composite image displays relative intensity and spatial distribution information for each transverse mode. Correlation with the shear force data allows mapping of the optical distributions to topographical features. Lasing filaments were observed at high drive currents. Gain competition among spatially overlapping transverse modes was observed while spatially isolated modes coexisted without competition.

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DO - 10.1117/12.345431

M3 - Conference article

AN - SCOPUS:0032672411

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SP - 208

EP - 216

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

SN - 0277-786X

T2 - Proceedings of the 1999 Testing, Packaging, Reliability, and Applications of Semiconductor Lasers IV

Y2 - 28 January 1999 through 28 January 1999

ER -

Spectral mapping of multimode vertical-cavity surface-emitting lasers by near-field scanning optical microscopy

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