Spectral self-interference fluorescence microscopy for subcellular imaging

Mehmet Dogan*, Ayçin Yalçin, Sumita Jain, Mareia B. Goldberg, Anna K. Swan, M. Selim Ünlü, Bennett B. Goldberg

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

14 Scopus citations


Spectral self-interference fluorescence microscopy (SSFM) has been recently developed to determine the axial position of fluorescent emitters placed on reflecting dielectric structures. In this paper, we review SSFM with emphasis on its axial localization capabilities. We show that there is a tradeoff between the numerical aperture (NA) of the microscopy system and the axial localization fidelity. To use high-NA objectives for better lateral resolution, we describe and demonstrate a high-NA 4Pi microscopy system that performs spectral self-interference microscopy for axial localization of less than 2 nm. We demonstrate axial localization by using artificial samples. We also probe the membrane topography oí a Shigella flexneri bacterium, several micrometers away from a solid support.

Original languageEnglish (US)
Pages (from-to)217-225
Number of pages9
JournalIEEE Journal on Selected Topics in Quantum Electronics
Issue number1
StatePublished - Jan 2008


  • Fluorescence microscopy
  • Localization
  • Selfinterference
  • Subcellular imaging

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering


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