Abstract
Soft X-ray microscopy allows one to study nanoscale heterogeneities in dry and wet environmental science, biological, polymer, and geochemical specimens. Recent advances in instrumentation at the X-1A beamline at the National Synchrotron Light Source at Brookhaven National Laboratory are described. Spectromicroscopy data analysis methods including component mapping and principal component analysis (PCA) are then discussed.
Original language | English (US) |
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Pages (from-to) | 185-191 |
Number of pages | 7 |
Journal | Surface Review and Letters |
Volume | 9 |
Issue number | 1 |
DOIs | |
State | Published - Feb 2002 |
Funding
We wish to thank Adam Hitchcock and Steve Wasserman for helpful discussions. Work supported by the National Science Foundation under grants DBI-9986819 and ECS-0099893.
ASJC Scopus subject areas
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry