TY - JOUR
T1 - Spectroscopic microscopy can quantify the statistics of subdiffractional refractive-index fluctuations in media with random rough surfaces
AU - Zhang, Di
AU - Cherkezyan, Lusik
AU - Capoglu, Ilker
AU - Subramanian, Hariharan
AU - Chandler, John
AU - Thompson, Sebastian
AU - Taflove, Allen
AU - Backman, Vadim
N1 - Publisher Copyright:
© 2015 Optical Society of America.
PY - 2015/11/1
Y1 - 2015/11/1
N2 - We previously established that spectroscopic microscopy can quantify subdiffraction-scale refractive index (RI) fluctuations in a label-free dielectric medium with a smooth surface. However, to study more realistic samples, such as biological cells, the effect of rough surface should be considered. In this Letter, we first report an analytical theory to synthesize microscopic images of a rough surface, validate this theory by finite-difference time-domain (FDTD) solutions of Maxwell's equations, and characterize the spectral properties of light reflected from a rough surface. Then, we report a technique to quantify the RI fluctuations beneath a rough surface and demonstrate its efficacy on FDTD-synthesized spectroscopic microscopy images, as well as experimental data obtained from biological cells.
AB - We previously established that spectroscopic microscopy can quantify subdiffraction-scale refractive index (RI) fluctuations in a label-free dielectric medium with a smooth surface. However, to study more realistic samples, such as biological cells, the effect of rough surface should be considered. In this Letter, we first report an analytical theory to synthesize microscopic images of a rough surface, validate this theory by finite-difference time-domain (FDTD) solutions of Maxwell's equations, and characterize the spectral properties of light reflected from a rough surface. Then, we report a technique to quantify the RI fluctuations beneath a rough surface and demonstrate its efficacy on FDTD-synthesized spectroscopic microscopy images, as well as experimental data obtained from biological cells.
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U2 - 10.1364/OL.40.004931
DO - 10.1364/OL.40.004931
M3 - Article
C2 - 26512486
AN - SCOPUS:84957580342
SN - 0146-9592
VL - 40
SP - 4931
EP - 4934
JO - Optics Letters
JF - Optics Letters
IS - 21
ER -