Spectrum measurement markets for tiered spectrum access

Arnob Ghosh, Randall Berry, Vaneet Aggarwal

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The recent framework for tiered spectrum sharing in the 3.5 GHz band establishes rules in which multiple firms called Environment Sensing Capability operators (ESCs) may measure spectrum occupancy and sell these measurements to other firms to help facilitate spectrum access. Motived by this we consider a scenario in which two spectrum access firms (SAs) seeks to access a shared band of spectrum and must in turn purchase spectrum measurements from one of two ESCs. Given the measurements they purchase, the SA firms then compete on price to serve customers in a shared band of spectrum. We study how differences in the quality and price of the spectrum measurements impact the resulting market equilibrium between the SAs and find that having different qualities of measurements available to different SAs can lead to better economic welfare.

Original languageEnglish (US)
Title of host publication2018 IEEE International Conference on Communications, ICC 2018 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781538631805
DOIs
StatePublished - Jul 27 2018
Event2018 IEEE International Conference on Communications, ICC 2018 - Kansas City, United States
Duration: May 20 2018May 24 2018

Publication series

NameIEEE International Conference on Communications
Volume2018-May
ISSN (Print)1550-3607

Other

Other2018 IEEE International Conference on Communications, ICC 2018
CountryUnited States
CityKansas City
Period5/20/185/24/18

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Electrical and Electronic Engineering

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  • Cite this

    Ghosh, A., Berry, R., & Aggarwal, V. (2018). Spectrum measurement markets for tiered spectrum access. In 2018 IEEE International Conference on Communications, ICC 2018 - Proceedings [8422512] (IEEE International Conference on Communications; Vol. 2018-May). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICC.2018.8422512