Specular X-ray reflectivity analysis of adhesion interface-dependent density profiles in nanometer-scale siloxane-based liquid films

G. Evmenenko; M. E. Van der Boom; C. J. Yu; J. Kmetko; P. Dutta

doi:10.1016/S0032-3861(02)00900-X

Specular X-ray reflectivity analysis of adhesion interface-dependent density profiles in nanometer-scale siloxane-based liquid films

G. Evmenenko^*, M. E. Van der Boom, C. J. Yu, J. Kmetko, P. Dutta

^*Corresponding author for this work

Physics and Astronomy

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Abstract

Nanometer-scale thick liquid films of poly(methylhydro-dimethyl)siloxane copolymer (PMDMS) deposited on hydrophilic and hydrophobic solid organic films have been studied using synchrotron X-ray specular reflectivity (XRR). The physico-chemical properties of liquid PMDMS at the interfacial level are controlled by the nature of the solid surface. Detailed analysis of the XRR-data revealed the formation of a low-density region in the liquid PMDMS film in the vicinity of the hydrophobic surface, whereas a densely packed molecular layer is formed at the liquid PMDMS-hydrophilic substrate interface. Non-covalent polymer chains are 'frozen' at the solid-liquid interfaces in the confined liquid films and interactions with the substrate surfaces (i.e. hydrogen bonding) are responsible for distinctly different density profiles.

Original language	English (US)
Pages (from-to)	1051-1056
Number of pages	6
Journal	Polymer
Volume	44
Issue number	4
DOIs	https://doi.org/10.1016/S0032-3861(02)00900-X
State	Published - Jan 17 2003

Keywords

Solid/liquid interface
Specular X-ray reflectivity
Thin liquid films

ASJC Scopus subject areas

Organic Chemistry
Polymers and Plastics
Materials Chemistry

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10.1016/S0032-3861(02)00900-X

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@article{dda6324903c541faadd8b38d8575e3ca,

title = "Specular X-ray reflectivity analysis of adhesion interface-dependent density profiles in nanometer-scale siloxane-based liquid films",

abstract = "Nanometer-scale thick liquid films of poly(methylhydro-dimethyl)siloxane copolymer (PMDMS) deposited on hydrophilic and hydrophobic solid organic films have been studied using synchrotron X-ray specular reflectivity (XRR). The physico-chemical properties of liquid PMDMS at the interfacial level are controlled by the nature of the solid surface. Detailed analysis of the XRR-data revealed the formation of a low-density region in the liquid PMDMS film in the vicinity of the hydrophobic surface, whereas a densely packed molecular layer is formed at the liquid PMDMS-hydrophilic substrate interface. Non-covalent polymer chains are 'frozen' at the solid-liquid interfaces in the confined liquid films and interactions with the substrate surfaces (i.e. hydrogen bonding) are responsible for distinctly different density profiles.",

keywords = "Solid/liquid interface, Specular X-ray reflectivity, Thin liquid films",

author = "G. Evmenenko and {Van der Boom}, {M. E.} and Yu, {C. J.} and J. Kmetko and P. Dutta",

note = "Funding Information: This work was supported by the US National Science Foundation under grant no. DMR-9978597 and by a research grant from the Henri Gutwirth fund for research. XRR measurements were performed in part at beam lines X23B of the National Synchrotron Light Source and 10-ID-B (Sector 10, MRCAT) of the Advanced Photon Source, which are supported by the US Department of Energy.",

year = "2003",

month = jan,

day = "17",

doi = "10.1016/S0032-3861(02)00900-X",

language = "English (US)",

volume = "44",

pages = "1051--1056",

journal = "Polymer",

issn = "0032-3861",

publisher = "Elsevier B.V.",

number = "4",

}

TY - JOUR

T1 - Specular X-ray reflectivity analysis of adhesion interface-dependent density profiles in nanometer-scale siloxane-based liquid films

AU - Evmenenko, G.

AU - Van der Boom, M. E.

AU - Yu, C. J.

AU - Kmetko, J.

AU - Dutta, P.

N1 - Funding Information: This work was supported by the US National Science Foundation under grant no. DMR-9978597 and by a research grant from the Henri Gutwirth fund for research. XRR measurements were performed in part at beam lines X23B of the National Synchrotron Light Source and 10-ID-B (Sector 10, MRCAT) of the Advanced Photon Source, which are supported by the US Department of Energy.

PY - 2003/1/17

Y1 - 2003/1/17

N2 - Nanometer-scale thick liquid films of poly(methylhydro-dimethyl)siloxane copolymer (PMDMS) deposited on hydrophilic and hydrophobic solid organic films have been studied using synchrotron X-ray specular reflectivity (XRR). The physico-chemical properties of liquid PMDMS at the interfacial level are controlled by the nature of the solid surface. Detailed analysis of the XRR-data revealed the formation of a low-density region in the liquid PMDMS film in the vicinity of the hydrophobic surface, whereas a densely packed molecular layer is formed at the liquid PMDMS-hydrophilic substrate interface. Non-covalent polymer chains are 'frozen' at the solid-liquid interfaces in the confined liquid films and interactions with the substrate surfaces (i.e. hydrogen bonding) are responsible for distinctly different density profiles.

AB - Nanometer-scale thick liquid films of poly(methylhydro-dimethyl)siloxane copolymer (PMDMS) deposited on hydrophilic and hydrophobic solid organic films have been studied using synchrotron X-ray specular reflectivity (XRR). The physico-chemical properties of liquid PMDMS at the interfacial level are controlled by the nature of the solid surface. Detailed analysis of the XRR-data revealed the formation of a low-density region in the liquid PMDMS film in the vicinity of the hydrophobic surface, whereas a densely packed molecular layer is formed at the liquid PMDMS-hydrophilic substrate interface. Non-covalent polymer chains are 'frozen' at the solid-liquid interfaces in the confined liquid films and interactions with the substrate surfaces (i.e. hydrogen bonding) are responsible for distinctly different density profiles.

KW - Solid/liquid interface

KW - Specular X-ray reflectivity

KW - Thin liquid films

UR - http://www.scopus.com/inward/record.url?scp=0347579831&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0347579831&partnerID=8YFLogxK

U2 - 10.1016/S0032-3861(02)00900-X

DO - 10.1016/S0032-3861(02)00900-X

M3 - Article

AN - SCOPUS:0347579831

SN - 0032-3861

VL - 44

SP - 1051

EP - 1056

JO - Polymer

JF - Polymer

IS - 4

ER -

Specular X-ray reflectivity analysis of adhesion interface-dependent density profiles in nanometer-scale siloxane-based liquid films

Abstract

Keywords

ASJC Scopus subject areas

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