Abstract
Specular x-ray reflectivity has been used to probe the structures of self-assembled monolayers and multilayers deposited using a three-step siloxane-based self-assembly technique that is repeated to form periodic multilayers. In films containing up to ten trilayers, it is found that the film thickness increases linearly as a function of the number of trilayers with no observable change in the surface roughness. Bragg peaks corresponding to the inter-trilayer spacing are observed. Both of these results indicate high structural regularity in these self-assembled multilayers. In self-assembled films with different constituent molecular building blocks, substantial and unexpected changes in the film structure occur as a result of subtle changes in the layers.
Original language | English (US) |
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Pages (from-to) | 645-652 |
Number of pages | 8 |
Journal | Journal of Chemical Physics |
Volume | 107 |
Issue number | 2 |
DOIs | |
State | Published - Jul 8 1997 |
ASJC Scopus subject areas
- General Physics and Astronomy
- Physical and Theoretical Chemistry