Specular x-ray reflectivity has been used to probe the structures of self-assembled monolayers and multilayers deposited using a three-step siloxane-based self-assembly technique that is repeated to form periodic multilayers. In films containing up to ten trilayers, it is found that the film thickness increases linearly as a function of the number of trilayers with no observable change in the surface roughness. Bragg peaks corresponding to the inter-trilayer spacing are observed. Both of these results indicate high structural regularity in these self-assembled multilayers. In self-assembled films with different constituent molecular building blocks, substantial and unexpected changes in the film structure occur as a result of subtle changes in the layers.
|Original language||English (US)|
|Number of pages||8|
|Journal||Journal of Chemical Physics|
|State||Published - Jul 8 1997|
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Physical and Theoretical Chemistry