Abstract
The high-pressure rocksalt structure of AlN was stabilized in epitaxial AlN/TiN(001) superlattices with AlN layer thickness ≤2.0 nm. The AlN layers were shown to be pure rocksalt-structure AlN, with a stress-free lattice parameter of 0.408 ± 0.002 nm, using x-ray diffraction, transmission electron microscopy, and electron energy loss spectroscopy. The stable hexagonal phase was observed for AlN layer thickness > 2 nm. The rocksalt structure formed at small layer thicknesses since it provided lower AlN/TiN interfacial energy than the hexagonal or zinc-blende structures.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 1743-1746 |
| Number of pages | 4 |
| Journal | Physical review letters |
| Volume | 78 |
| Issue number | 9 |
| DOIs | |
| State | Published - Mar 3 1997 |
ASJC Scopus subject areas
- Physics and Astronomy(all)
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Madan, A., Kim, I. W., Cheng, S. C., Yashar, P., Dravid, V. P., & Barnett, S. A. (1997). Stabilization of cubic AlN in epitaxial AlN/TiN superlattices. Physical review letters, 78(9), 1743-1746. https://doi.org/10.1103/PhysRevLett.78.1743