Abstract
A transmission electron microscopy study of CrN0.6/TiN superlattices deposited by reactive magnetron sputtering is described. The stable structure of CrN0.60 is hexagonal, but high resolution transmission electron microscopy images of the superlattices showed that CrN0.6 layers ≤10 nm thick were cubic, while 50 nm thick layers were hexagonal. That is, the cubic CrN structure was "epitaxially stabilized" by the cubic TiN, with which there is a 2.4% lattice mismatch. The superlattices with hexagonal CrN0.6 showed high strains and defect densities within ≈5 nm of each interface, presumably due to the 5.4% volume decrease associated with the cubic-to-hexagonal transformation. The effect of this strain on the transformation is discussed.
Original language | English (US) |
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Pages (from-to) | 987-989 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 72 |
Issue number | 8 |
DOIs | |
State | Published - 1998 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)