Abstract
Aluminium nitride (AIN)/tungsten (W) superlattices with bilayer periods of 3.5-7 nm were grown on magnesium oxide (MgO) using magnetron sputtering. The cubic phase of AlN was observed using high resolution cross-sectional transmission electron microscopy and x-ray diffraction (XRD). The pole figure XRD showed the reflection that matched the theoretically predicted interplanar spacing of zinc-blende phase (Zn-AlN). The XRD scans showed rapid decrease in satellite peak intensities when thickness was increased above 1.5 nm.
Original language | English (US) |
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Pages (from-to) | 2069-2073 |
Number of pages | 5 |
Journal | Journal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films |
Volume | 19 |
Issue number | 5 |
DOIs | |
State | Published - Sep 2001 |
ASJC Scopus subject areas
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films