STATICS AND DYNAMICS OF "CHARGED" INTERFACES IN ELECTROCERAMICS

Xiwei Lin; Conal Murray; Vinayak P. Dravid

doi:10.1017/S1431927600022881

STATICS AND DYNAMICS OF "CHARGED" INTERFACES IN ELECTROCERAMICS

Xiwei Lin, Conal Murray, Vinayak P. Dravid^*

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Original language	English (US)
Pages (from-to)	552-553
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	4
DOIs	https://doi.org/10.1017/S1431927600022881
State	Published - Jul 1 1998

ASJC Scopus subject areas

Instrumentation

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title = "STATICS AND DYNAMICS OF {"}CHARGED{"} INTERFACES IN ELECTROCERAMICS",

author = "Xiwei Lin and Conal Murray and Dravid, {Vinayak P.}",

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AU - Lin, Xiwei

AU - Murray, Conal

AU - Dravid, Vinayak P.

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M3 - Article

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SP - 552

EP - 553

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -

STATICS AND DYNAMICS OF "CHARGED" INTERFACES IN ELECTROCERAMICS

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