Statistics of the atom-by-atom dissection of planes in an atom-probe field-ion microscope: The number of atoms detected per plane

Albert T. Macrander*, Masahiko Yamamoto, David N. Seidman, S. S. Brenner

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Fingerprint

Dive into the research topics of 'Statistics of the atom-by-atom dissection of planes in an atom-probe field-ion microscope: The number of atoms detected per plane'. Together they form a unique fingerprint.

INIS

Engineering

Material Science