Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI: Proceedings of SPIE OPTO

Selim M Shahriar (Editor), Jacob Scheuer

Research output: Book/Report › Book

Cite this

@book{155d31ccd981495286dfd853bd65dd05,

title = "Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI: Proceedings of SPIE OPTO",

author = "Jacob Scheuer",

editor = "Shahriar, {Selim M}",

note = "https://doi.org/10.1117/12.2323186; ",

year = "2018",

language = "English (US)",

isbn = "978-1510615816",

volume = "10548",

publisher = "SPIE",

}