Strength of ultrananocrystalline diamond thin films - Identification of Weinbull parameters

B. Peng, Horacio Dante Espinosa*, N. Moldovan, X. Xiao, O. Auciello, J. A. Carlisle, D. M. Gruen, R. S. Divan, D. C. Mancini, J. E. Gerbi, J. Birrell

*Corresponding author for this work

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