Stroboscopic x-ray diffraction measurements of sub-ns domain dynamics in ferroelectric films

E. Zolotoyabko*, J. P. Quintana, D. J. Towner, B. W. Wessels

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations


We used the Advanced Photon Source (APS) at Argonne National Laboratory to perform fast (ps range) time-resolved diffraction measurements of the dynamic characteristics in BaTiO3 films subjected to strong high-frequency electric fields. The time-dependent lattice response measured at frequencies between 6.5 MHz and 1.3 GHz revealed damped domain movements with attenuation time rapidly increasing with electric field frequency, v. We found that at frequencies higher than v ≈ 600 MHz the domain motions in BaTiO3 films become heavily damped, information that may be important to future device operation. A minimum attenuation time, τ ≈ 330 ps, measured at v = 1.3 GHz was limited by the time constant of the electrical circuit.

Original languageEnglish (US)
Article numberG5.2
Pages (from-to)183-188
Number of pages6
JournalMaterials Research Society Symposium Proceedings
StatePublished - 2005
EventMaterials, Intergration and Packaging Issues for High-Frequency Devices II - Boston, MA, United States
Duration: Nov 29 2004Dec 1 2004

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering


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