Structural and thermoelectric properties in (Sb1-xBi x)2Te3 thin films

S. Cho*, Y. Kim, J. B. Ketterson

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

We have investigated the structural and thermoelectric properties of (Sb1-xBix)2Te3 thin films on CdTe(111)B. Analysis of X-ray diffraction patterns (θ-2θ scans and rocking curves) of the films shows that they are of high quality and that they are well aligned with their (00.1) axis normal to the substrates. Measurements of the temperature-dependent thermoelectric power, resistivity, and Hall coefficient of the films were performed with respect to the binary composition, x. For the samples in the range 0.2 < x < 0.3, the room-temperature thermopower values were in the range 159-184 μV/K, the room-temperature carrier concentrations were 3.93-5.13 × 1019 cm-3, and the room-temperature mobilities were 24.6-64.0 cm2 V-1 s-1.

Original languageEnglish (US)
Pages (from-to)1729-1731
Number of pages3
JournalApplied Physics A: Materials Science and Processing
Volume79
Issue number7
DOIs
StatePublished - Nov 1 2004

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)

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