Structural anisotropy in amorphous SnO2 film probed by X-ray absorption spectroscopy

Q. Zhu, Q. Ma*, D. B. Buchholz, R. P.H. Chang, M. J. Bedzyk, T. O. Mason

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

Polarization-dependent X-ray absorption measurements reveal the existence of structural anisotropy in amorphous (a-) SnO2 film. The anisotropy is readily seen for the second neighbor interaction whose magnitude differs along three measured directions. The differences can be well accounted for by 10%-20% variation in the Debye-Waller factor. Instead of a single Gaussian distribution found in crystalline SnO2, the Sn-O bond distribution is bimodal in a-SnO2 whose separation shows a weak angular dependence. The oxygen vacancies, existing in the a-SnO2 film in the order of 1021 cm-3, distribute preferentially along the film surface direction.

Original languageEnglish (US)
Article number031913
JournalApplied Physics Letters
Volume103
Issue number3
DOIs
StatePublished - Jul 15 2013

Funding

Film growth, electrical characterization, and X-ray absorption measurements were supported by the NSF Materials Research Science and Engineering Center at Northwestern under Grant No. DMR-1121262. Optical characterization and structural analysis were supported by the ANSER Center, an Energy Frontier Research Center funded by the U.S. Department of Energy, Office of Basic Energy Sciences, under Award No. DE-SC0001059. X-ray absorption measurements were conducted at the DND-CAT at the Advanced Photon Source (APS). DND-CAT was supported by E.I. DuPont de Nemours & Co., The Dow Chemical Company, and the State of Illinois. Use of the APS was supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357.

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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