@inproceedings{ed911f6c8e5e4d889edba57b268e3a35,
title = "Structural characterization and magnetization reversal of 0.1 μm scale antidot-type arrays patterned by Ga+ irradiation",
abstract = "In this article, we present conventional transmission electron microscopy (TEM), Lorentz TEM and micromagnetic simulation, the relation between the structural changes accompanying the irradiation process and the magnetisation reversal of magnetic films patterned with arrays of 0.1 μm scale square antidots. The arrays have been fabricated in Co thin film as well as NiFe thin film using a focused ion beam system.",
keywords = "Atomic layer deposition, Electron microscopy, Gas insulated transmission lines, Magnetic films, Magnetic force microscopy, Magnetic materials, Magnetic properties, Magnetization reversal, Sputtering, Transmission electron microscopy",
author = "Owen, {N. W.} and Petford-Long, {A. K.}",
year = "2003",
month = jan,
day = "1",
doi = "10.1109/INTMAG.2003.1230643",
language = "English (US)",
series = "Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "Intermag 2003 - Program of the 2003 IEEE International Magnetics Conference",
address = "United States",
note = "2003 IEEE International Magnetics Conference, Intermag 2003 ; Conference date: 30-03-2003 Through 03-04-2003",
}