Abstract
The structural characterization and magnetization reversal of 0.1 μm scale antidot-type arrays patterned by Ga ions irradiation were discussed. The arrays were fabricated in Co thin films and NiFe thin films using a focused ion beam. From the absence of cracks it was proved that recrystallization of the films had occurred under FIB irradiation.
| Original language | English (US) |
|---|---|
| Journal | Digests of the Intermag Conference |
| State | Published - Oct 1 2003 |
| Event | Intermag 2003: International Magnetics Conference - Boston, MA, United States Duration: Mar 28 2003 → Apr 3 2003 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering