Structure of a passivated Ge surface prepared from aqueous solution

P. F. Lyman*, O. Sakata, D. L. Marasco, T. L. Lee, K. D. Breneman, D. T. Keane, M. J. Bedzyk

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

40 Scopus citations

Abstract

The structure of a passivating sulfide layer on Ge(001) was studied using X-ray standing waves and X-ray fluorescence. The sulfide layer was formed by reacting clean Ge substrates in (NH4)2S solutions of various concentrations at 80 °C. For each treatment, a sulfide layer containing approximately two to three monolayers (ML) of S was formed on the surface, and an ordered structure was found at the interface that contained approximately 0.4 ML of S. Our results suggest the rapid formation of a glassy GeSx layer containing 1.5-2.5 ML S residing atop a partially ordered interfacial layer of bridge-bonded S. The passivating reaction appears to be self-limited to 2-3 ML at this reaction temperature.

Original languageEnglish (US)
Pages (from-to)L594-L598
JournalSurface Science
Volume462
Issue number1
DOIs
StatePublished - Aug 10 2000

Funding

The authors gratefully acknowledge the help of P. Baldo in acquiring the RBS spectra. This work was supported by the US Department of Energy under Contract No. W-31-109-ENG-38 to Argonne National Laboratory and Contract DE-F02-96ER45588 to Northwestern University, and by the National Science Foundation under Contracts No. DMR-9632472 to the MRC at Northwestern University, DMR-9632593 and DMR-9973436 to MJB, and DMR-9304725 to DND, and by the State of Illinois under Contract No. IBHE HECA NWU 96 to DND.

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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