Structure of planar defects in (Sr0.9Ca0.3)1.1CuO2 infinite-layer superconductors by quantitative high-resolution electron microscopy

H. Zhang; L. D. Marks; Y. Y. Wang; H. Zhang; V. P. Dravid; P. Han; D. A. Payne

doi:10.1016/0304-3991(94)00142-A

Structure of planar defects in (Sr_0.9Ca_0.3)_1.1CuO₂ infinite-layer superconductors by quantitative high-resolution electron microscopy

H. Zhang, L. D. Marks, Y. Y. Wang, H. Zhang, V. P. Dravid, P. Han, D. A. Payne

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

18 Scopus citations

Abstract

Planar defects in the infinite-layer (Sr_1-xCa_x)_yCuO₂ structure are believed to be responsible for superconductivity with T_c up to 110 K. In this work we present χ² minimization results to best fit a set of through-focal HREM images of such defects. Optimized atomic positions of the defect with an error bar of about 0.1Åare determined. The experimental parameters for simulated defect images such as sample thickness and objective lens defocus are determined by χ² fitting of the corresponding experimental HREM images of the matrix.

Original language	English (US)
Pages (from-to)	103-111
Number of pages	9
Journal	Ultramicroscopy
Volume	57
Issue number	1
DOIs	https://doi.org/10.1016/0304-3991(94)00142-A
State	Published - 1995

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

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title = "Structure of planar defects in (Sr0.9Ca0.3)1.1CuO2 infinite-layer superconductors by quantitative high-resolution electron microscopy",

abstract = "Planar defects in the infinite-layer (Sr1-xCax)yCuO2 structure are believed to be responsible for superconductivity with Tc up to 110 K. In this work we present χ2 minimization results to best fit a set of through-focal HREM images of such defects. Optimized atomic positions of the defect with an error bar of about 0.1{\AA}are determined. The experimental parameters for simulated defect images such as sample thickness and objective lens defocus are determined by χ2 fitting of the corresponding experimental HREM images of the matrix.",

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year = "1995",

doi = "10.1016/0304-3991(94)00142-A",

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T1 - Structure of planar defects in (Sr0.9Ca0.3)1.1CuO2 infinite-layer superconductors by quantitative high-resolution electron microscopy

AU - Zhang, H.

AU - Marks, L. D.

AU - Wang, Y. Y.

AU - Zhang, H.

AU - Dravid, V. P.

AU - Han, P.

AU - Payne, D. A.

PY - 1995

Y1 - 1995

N2 - Planar defects in the infinite-layer (Sr1-xCax)yCuO2 structure are believed to be responsible for superconductivity with Tc up to 110 K. In this work we present χ2 minimization results to best fit a set of through-focal HREM images of such defects. Optimized atomic positions of the defect with an error bar of about 0.1Åare determined. The experimental parameters for simulated defect images such as sample thickness and objective lens defocus are determined by χ2 fitting of the corresponding experimental HREM images of the matrix.

AB - Planar defects in the infinite-layer (Sr1-xCax)yCuO2 structure are believed to be responsible for superconductivity with Tc up to 110 K. In this work we present χ2 minimization results to best fit a set of through-focal HREM images of such defects. Optimized atomic positions of the defect with an error bar of about 0.1Åare determined. The experimental parameters for simulated defect images such as sample thickness and objective lens defocus are determined by χ2 fitting of the corresponding experimental HREM images of the matrix.

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IS - 1

ER -

Structure of planar defects in (Sr_0.9Ca_0.3)_1.1CuO₂ infinite-layer superconductors by quantitative high-resolution electron microscopy

Abstract

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