Structures and local polarized domains of ferroelectric organic films studied by atomic force microscopy

Xinqi Chen*, Hirofumi Yamada, Toshihisa Horiuchi, Kazumi Matsushige

*Corresponding author for this work

Research output: Contribution to journalArticle

34 Scopus citations

Abstract

We have investigated the surface structures and the local polarized domains of the copolymer thin films of vinylidene flouride and trifluoroethylene (P(VDF/TrFE)) by atomic force microscopy (AFM). AFM observation revealed that the films consisted of "rod-like" that the surface morphology depended strongly on the annealing condition. We also observed that pairs of "rod-like" grains were gradually formed depending on the length of the annealing time. The local polarized domains were fabricated by applying a high electric field to the film with a conducting AFM tip. The piezoelectric response of the film was detected using the tip with an oscillating electric field and imaged with the topographic images taken simultaneously. The X-ray profile suggested that the thin films had a β-type crystalline structure.

Original languageEnglish (US)
Pages (from-to)3834-3837
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume37
Issue number6 SUPPL. B
DOIs
StatePublished - Jun 1998

Keywords

  • Annealing temperature
  • Annealing time
  • Atomic force microscopy
  • P(VDF/TrFE)
  • Piezoelectric response
  • Polarized domain
  • Surface morphology

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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