Structures of AlN/VN superlattices with different AlN layer thicknesses

Quan Li; I. W. Kim; S. A. Barnett; L. D. Marks

doi:10.1557/JMR.2002.0181

Structures of AlN/VN superlattices with different AlN layer thicknesses

Quan Li, I. W. Kim, S. A. Barnett, L. D. Marks

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

34 Scopus citations

Abstract

AlN/VN superlattices with different periods were studied using x-ray diffraction and transmission electron microscopy (TEM). A phase transformation of the AlN from an epitaxially stabilized rock-salt structure to a hexagonal wurtzite structure was observed for an AlN layer thickness greater than 4 nm. A structural model is proposed on the basis of TEM results for the orientation of the transformed phase. The VN layer grown on top of the hexagonal AlN was observed to be reoriented compared to that in the stabilized B1-AlN/VN. The VN nucleated by taking the w-AlN(002) plane as its (111) plane instead of the (002) plane.

Original language	English (US)
Pages (from-to)	1224-1231
Number of pages	8
Journal	Journal of Materials Research
Volume	17
Issue number	5
DOIs	https://doi.org/10.1557/JMR.2002.0181
State	Published - May 2002

Funding

This work was supported by the MRSEC program of the National Science Foundation (DMR-9632472) at the Materials Research Center of Northwestern University.

ASJC Scopus subject areas

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

Access to Document

10.1557/JMR.2002.0181

Cite this

@article{ec05f6ec542c4f8fa2c01d2e00973b4a,

title = "Structures of AlN/VN superlattices with different AlN layer thicknesses",

abstract = "AlN/VN superlattices with different periods were studied using x-ray diffraction and transmission electron microscopy (TEM). A phase transformation of the AlN from an epitaxially stabilized rock-salt structure to a hexagonal wurtzite structure was observed for an AlN layer thickness greater than 4 nm. A structural model is proposed on the basis of TEM results for the orientation of the transformed phase. The VN layer grown on top of the hexagonal AlN was observed to be reoriented compared to that in the stabilized B1-AlN/VN. The VN nucleated by taking the w-AlN(002) plane as its (111) plane instead of the (002) plane.",

author = "Quan Li and Kim, {I. W.} and Barnett, {S. A.} and Marks, {L. D.}",

note = "Funding Information: This work was supported by the MRSEC program of the National Science Foundation (DMR-9632472) at the Materials Research Center of Northwestern University.",

year = "2002",

month = may,

doi = "10.1557/JMR.2002.0181",

language = "English (US)",

volume = "17",

pages = "1224--1231",

journal = "Journal of Materials Research",

issn = "0884-2914",

publisher = "Materials Research Society",

number = "5",

}

TY - JOUR

T1 - Structures of AlN/VN superlattices with different AlN layer thicknesses

AU - Li, Quan

AU - Kim, I. W.

AU - Barnett, S. A.

AU - Marks, L. D.

N1 - Funding Information: This work was supported by the MRSEC program of the National Science Foundation (DMR-9632472) at the Materials Research Center of Northwestern University.

PY - 2002/5

Y1 - 2002/5

N2 - AlN/VN superlattices with different periods were studied using x-ray diffraction and transmission electron microscopy (TEM). A phase transformation of the AlN from an epitaxially stabilized rock-salt structure to a hexagonal wurtzite structure was observed for an AlN layer thickness greater than 4 nm. A structural model is proposed on the basis of TEM results for the orientation of the transformed phase. The VN layer grown on top of the hexagonal AlN was observed to be reoriented compared to that in the stabilized B1-AlN/VN. The VN nucleated by taking the w-AlN(002) plane as its (111) plane instead of the (002) plane.

AB - AlN/VN superlattices with different periods were studied using x-ray diffraction and transmission electron microscopy (TEM). A phase transformation of the AlN from an epitaxially stabilized rock-salt structure to a hexagonal wurtzite structure was observed for an AlN layer thickness greater than 4 nm. A structural model is proposed on the basis of TEM results for the orientation of the transformed phase. The VN layer grown on top of the hexagonal AlN was observed to be reoriented compared to that in the stabilized B1-AlN/VN. The VN nucleated by taking the w-AlN(002) plane as its (111) plane instead of the (002) plane.

UR - http://www.scopus.com/inward/record.url?scp=0036565056&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0036565056&partnerID=8YFLogxK

U2 - 10.1557/JMR.2002.0181

DO - 10.1557/JMR.2002.0181

M3 - Article

AN - SCOPUS:0036565056

SN - 0884-2914

VL - 17

SP - 1224

EP - 1231

JO - Journal of Materials Research

JF - Journal of Materials Research

IS - 5

ER -

Structures of AlN/VN superlattices with different AlN layer thicknesses

Abstract

Funding

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this