Structures of AlN/VN superlattices with different AlN layer thicknesses

Quan Li, I. W. Kim, S. A. Barnett, L. D. Marks

Research output: Contribution to journalArticlepeer-review

30 Scopus citations

Abstract

AlN/VN superlattices with different periods were studied using x-ray diffraction and transmission electron microscopy (TEM). A phase transformation of the AlN from an epitaxially stabilized rock-salt structure to a hexagonal wurtzite structure was observed for an AlN layer thickness greater than 4 nm. A structural model is proposed on the basis of TEM results for the orientation of the transformed phase. The VN layer grown on top of the hexagonal AlN was observed to be reoriented compared to that in the stabilized B1-AlN/VN. The VN nucleated by taking the w-AlN(002) plane as its (111) plane instead of the (002) plane.

Original languageEnglish (US)
Pages (from-to)1224-1231
Number of pages8
JournalJournal of Materials Research
Volume17
Issue number5
DOIs
StatePublished - May 2002

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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