Studies of Fe/Cr multilayer and trilayer films

E. M. Ho*, A. C. Daykin, A. K. Petford-Long

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

Series of sputter-deposited Fe3 nm/Crx multilayer and Fe/Cr/Fe trilayer films have been analyzed. The small magnetoresistance exhibited by the multilayer films is attributed to very rough interfaces and poor Cr layer quality. The hysteresis loop data show the interlayer exchange coupling to be predominantly antiferromagnetic. In situ magnetizing of the trilayer films in a Lorentz TEM showed that for a 1.2 nm thick Cr layer the moments of the Fe layers lie approximately parallel at remanence \ rotating to antiparallel only when the field is increased. The magnetic moments in an Fe12 nm/Cr0.6 nm/Fe12 nm trilayer film were found to be parallel aligned under an applied field whereas the hysteresis loop for the multilayer films with the same Cr thickness suggest the existence of antiferromagnetic interlayer exchange coupling.

Original languageEnglish (US)
Pages (from-to)6292-6294
Number of pages3
JournalJournal of Applied Physics
Volume79
Issue number8 PART 2B
DOIs
StatePublished - Apr 15 1996

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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