ETUDE DES DEFAUTS DANS LES COUCHES HETEROEPITAXIALES DE MATERIAUX III-V PAR L'ANALYSE METALLOGRAPHIQUE SUR BISEAU CHIMIQUE.

A. M. Huber; G. Laurencin; M. Razeghi

ETUDE DES DEFAUTS DANS LES COUCHES HETEROEPITAXIALES DE MATERIAUX III-V PAR L'ANALYSE METALLOGRAPHIQUE SUR BISEAU CHIMIQUE.

Translated title of the contribution: Study of Defects in the Heteroepitaxial Layers of III-V Materials by Metallographic Analysis on a Chemical Bevel.

A. M. Huber^*, G. Laurencin, M. Razeghi

^*Corresponding author for this work

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Scopus citations

Abstract

The 'etch pit' observation technique has been developed for the study of the crystalline perfection of mono and multilayer heterostructure. Before the selective revelation the authors formed a chemical bevel with a very low angle. By this technique, the presence of misfit dislocation at the interface may be determined.

Translated title of the contribution	Study of Defects in the Heteroepitaxial Layers of III-V Materials by Metallographic Analysis on a Chemical Bevel.
Original language	French
Title of host publication	Journal de Physique (Paris), Colloque
Pages	409-414
Number of pages	6
Edition	9
State	Published - Sep 1983

Publication series

Name	Journal de Physique (Paris), Colloque
Number	9
Volume	44
ISSN (Print)	0449-1947

ASJC Scopus subject areas

General Engineering

Cite this

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title = "ETUDE DES DEFAUTS DANS LES COUCHES HETEROEPITAXIALES DE MATERIAUX III-V PAR L'ANALYSE METALLOGRAPHIQUE SUR BISEAU CHIMIQUE.",

abstract = "The 'etch pit' observation technique has been developed for the study of the crystalline perfection of mono and multilayer heterostructure. Before the selective revelation the authors formed a chemical bevel with a very low angle. By this technique, the presence of misfit dislocation at the interface may be determined.",

author = "Huber, {A. M.} and G. Laurencin and M. Razeghi",

year = "1983",

month = sep,

language = "French",

isbn = "2902731639",

series = "Journal de Physique (Paris), Colloque",

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}

ETUDE DES DEFAUTS DANS LES COUCHES HETEROEPITAXIALES DE MATERIAUX III-V PAR L'ANALYSE METALLOGRAPHIQUE SUR BISEAU CHIMIQUE. / Huber, A. M.; Laurencin, G.; Razeghi, M.
Journal de Physique (Paris), Colloque. 9. ed. 1983. p. 409-414 (Journal de Physique (Paris), Colloque; Vol. 44, No. 9).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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T1 - ETUDE DES DEFAUTS DANS LES COUCHES HETEROEPITAXIALES DE MATERIAUX III-V PAR L'ANALYSE METALLOGRAPHIQUE SUR BISEAU CHIMIQUE.

AU - Huber, A. M.

AU - Laurencin, G.

AU - Razeghi, M.

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N2 - The 'etch pit' observation technique has been developed for the study of the crystalline perfection of mono and multilayer heterostructure. Before the selective revelation the authors formed a chemical bevel with a very low angle. By this technique, the presence of misfit dislocation at the interface may be determined.

AB - The 'etch pit' observation technique has been developed for the study of the crystalline perfection of mono and multilayer heterostructure. Before the selective revelation the authors formed a chemical bevel with a very low angle. By this technique, the presence of misfit dislocation at the interface may be determined.

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M3 - Conference contribution

AN - SCOPUS:0020813582

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T3 - Journal de Physique (Paris), Colloque

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BT - Journal de Physique (Paris), Colloque

ER -

ETUDE DES DEFAUTS DANS LES COUCHES HETEROEPITAXIALES DE MATERIAUX III-V PAR L'ANALYSE METALLOGRAPHIQUE SUR BISEAU CHIMIQUE.

Abstract

Publication series

ASJC Scopus subject areas

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