Study of magnetic thin films deposited by closed-field unbalanced magnetron sputtering

M. W. Ormston; A. K. Petford-Long; D. G. Teer

doi:10.1063/1.370113

Study of magnetic thin films deposited by closed-field unbalanced magnetron sputtering

M. W. Ormston^*, A. K. Petford-Long, D. G. Teer

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

Abstract

The effects of changing the spacer layer material, underlayer material, layer thickness, and roughness of interfaces on the magnetization reversal and structure of Py/Cu/Py and Py/Au/Py magnetic multilayer thin films were examined. The magnetic domain structure of the films was studied by Lorentz transmission electron microscopy, and the in situ magnetization by transmission electron microscopy. The results of depositing magnetic thin films using the closed-field unbalanced magnetron sputter ion plating are discussed.

Original language	English (US)
Pages (from-to)	5747-5749
Number of pages	3
Journal	Journal of Applied Physics
Volume	85
Issue number	8 II B
DOIs	https://doi.org/10.1063/1.370113
State	Published - Apr 15 1999
Event	Proceedings of the 43rd Annual Conference on Magnetism and Magnetic Materials - Miami, FL, USA Duration: Nov 9 1998 → Nov 12 1998

ASJC Scopus subject areas

Physics and Astronomy(all)

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10.1063/1.370113

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title = "Study of magnetic thin films deposited by closed-field unbalanced magnetron sputtering",

abstract = "The effects of changing the spacer layer material, underlayer material, layer thickness, and roughness of interfaces on the magnetization reversal and structure of Py/Cu/Py and Py/Au/Py magnetic multilayer thin films were examined. The magnetic domain structure of the films was studied by Lorentz transmission electron microscopy, and the in situ magnetization by transmission electron microscopy. The results of depositing magnetic thin films using the closed-field unbalanced magnetron sputter ion plating are discussed.",

author = "Ormston, {M. W.} and Petford-Long, {A. K.} and Teer, {D. G.}",

year = "1999",

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language = "English (US)",

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journal = "Journal of Applied Physics",

issn = "0021-8979",

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note = "Proceedings of the 43rd Annual Conference on Magnetism and Magnetic Materials ; Conference date: 09-11-1998 Through 12-11-1998",

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T1 - Study of magnetic thin films deposited by closed-field unbalanced magnetron sputtering

AU - Ormston, M. W.

AU - Petford-Long, A. K.

AU - Teer, D. G.

PY - 1999/4/15

Y1 - 1999/4/15

N2 - The effects of changing the spacer layer material, underlayer material, layer thickness, and roughness of interfaces on the magnetization reversal and structure of Py/Cu/Py and Py/Au/Py magnetic multilayer thin films were examined. The magnetic domain structure of the films was studied by Lorentz transmission electron microscopy, and the in situ magnetization by transmission electron microscopy. The results of depositing magnetic thin films using the closed-field unbalanced magnetron sputter ion plating are discussed.

AB - The effects of changing the spacer layer material, underlayer material, layer thickness, and roughness of interfaces on the magnetization reversal and structure of Py/Cu/Py and Py/Au/Py magnetic multilayer thin films were examined. The magnetic domain structure of the films was studied by Lorentz transmission electron microscopy, and the in situ magnetization by transmission electron microscopy. The results of depositing magnetic thin films using the closed-field unbalanced magnetron sputter ion plating are discussed.

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U2 - 10.1063/1.370113

DO - 10.1063/1.370113

M3 - Conference article

AN - SCOPUS:0032606311

SN - 0021-8979

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SP - 5747

EP - 5749

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 8 II B

T2 - Proceedings of the 43rd Annual Conference on Magnetism and Magnetic Materials

Y2 - 9 November 1998 through 12 November 1998

ER -

Study of magnetic thin films deposited by closed-field unbalanced magnetron sputtering

Abstract

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