Study of magnetic thin films deposited by closed-field unbalanced magnetron sputtering

M. W. Ormston*, A. K. Petford-Long, D. G. Teer

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations

Abstract

The effects of changing the spacer layer material, underlayer material, layer thickness, and roughness of interfaces on the magnetization reversal and structure of Py/Cu/Py and Py/Au/Py magnetic multilayer thin films were examined. The magnetic domain structure of the films was studied by Lorentz transmission electron microscopy, and the in situ magnetization by transmission electron microscopy. The results of depositing magnetic thin films using the closed-field unbalanced magnetron sputter ion plating are discussed.

Original languageEnglish (US)
Pages (from-to)5747-5749
Number of pages3
JournalJournal of Applied Physics
Volume85
Issue number8 II B
DOIs
StatePublished - Apr 15 1999
EventProceedings of the 43rd Annual Conference on Magnetism and Magnetic Materials - Miami, FL, USA
Duration: Nov 9 1998Nov 12 1998

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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