Study of Raman-Ramsey fringes for enhanced precision in a chip scale Rb clock

G. S. Pati*, K. Salit, Selim M Shahriar

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

We report observation of high contrast Raman-Ramsey fringes using time delayed optical pulse pairs in a rubidium vapor cell. The width of these fringes are not limited by saturation and provides a simpler means to produce narrow atomic linewidths using a thermal vapor medium for compact atomic clock applications. We also demonstrate phasescanned Raman-Ramsey fringes, with potential application to sensitive detection of trace vapors.

Original languageEnglish (US)
Title of host publicationQuantum Electronics Metrology
DOIs
StatePublished - Mar 24 2008
EventQuantum Electronics Metrology, QEM - San Jose, CA, United States
Duration: Jan 20 2008Jan 21 2008

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6906
ISSN (Print)0277-786X

Other

OtherQuantum Electronics Metrology, QEM
CountryUnited States
CitySan Jose, CA
Period1/20/081/21/08

Keywords

  • Atomic clock
  • Raman-Ramsey fringes
  • Rubidium vapor

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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    Pati, G. S., Salit, K., & Shahriar, S. M. (2008). Study of Raman-Ramsey fringes for enhanced precision in a chip scale Rb clock. In Quantum Electronics Metrology [69060D] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 6906). https://doi.org/10.1117/12.772332