Study of TaSi2-Si crystals with high energy synchrotron radiation as tunable wide-bandpass monochromator and analyzer optics

U. Rütt*, S. R. Stock, Z. U. Rek

*Corresponding author for this work

Research output: Contribution to journalConference article

Abstract

Single crystals of the in situ composite TaSi2-Si are candidates for wide bandpass monochromators and analyzers for x-ray experiments. Two large crystals (32 × 39 × 7 mm3 and 32 × 39 × 30 mm3) were studied in detail using 115 keV synchrotron radiation at the BESSRC beamline at the APS. For transmission geometry, the Si(111) reflection and 39 mm crystal thickness, rocking curve widths of 95 arc sec with reflectivities of 50% were measured over the entire crystal. Turning the crystal to an angle of 45° to the incident beam and translating it through the beam allowed investigation of the influence of crystal thickness on diffracted intensity. For sample thicknesses ranging between 5 mm and 12.5 mm, the full width at half maximum (FWHM) of the rocking curve increased linearly from 29 arc sec to 53 arc sec. The greatest gain in integrated intensity was obtained for 8-9 mm thickness where FWHM = 40 arc sec. If this crystal were used as a monochromator for synchrotron radiation, it would provide 40 times more intensity than a perfect silicon crystal and an energy bandwidth of 1 keV at 115 keV photon energy. With the increase of the rocking curve FWHM, a plateau across the peak maximum developed; its width increased from 5 arc sec to 25 arc sec when the crystal thickness increased from 5 mm to 12.5 mm, respectively. This plateau allows these crystals to be used as analyzer crystals in diffraction experiments, i.e., as very narrow slits to suppress background. A plateau width of about 5-20 arc sec for the analyzer crystal is needed to insure that the entire intensity scattered from a sample is delivered to the detector. The simple expedient of changing the crystal thickness alters the plateau width of the analyzer crystal and tunes its acceptance to the needs of the sample under study.

Original languageEnglish (US)
JournalMaterials Research Society Symposium - Proceedings
Volume678
StatePublished - Dec 1 2001
EventApplications of Synchrotron Radiation Techniques to Materials Science VI - San Francisco, CA, United States
Duration: Apr 16 2001Apr 20 2001

Fingerprint

Monochromators
monochromators
Synchrotron radiation
Optics
analyzers
synchrotron radiation
optics
Crystals
crystals
arcs
energy
plateaus
Full width at half maximum
curves
translating
Silicon
acceptability
slits
Photons

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

@article{a459ac03a22d4ea682102ee89d719d50,
title = "Study of TaSi2-Si crystals with high energy synchrotron radiation as tunable wide-bandpass monochromator and analyzer optics",
abstract = "Single crystals of the in situ composite TaSi2-Si are candidates for wide bandpass monochromators and analyzers for x-ray experiments. Two large crystals (32 × 39 × 7 mm3 and 32 × 39 × 30 mm3) were studied in detail using 115 keV synchrotron radiation at the BESSRC beamline at the APS. For transmission geometry, the Si(111) reflection and 39 mm crystal thickness, rocking curve widths of 95 arc sec with reflectivities of 50{\%} were measured over the entire crystal. Turning the crystal to an angle of 45° to the incident beam and translating it through the beam allowed investigation of the influence of crystal thickness on diffracted intensity. For sample thicknesses ranging between 5 mm and 12.5 mm, the full width at half maximum (FWHM) of the rocking curve increased linearly from 29 arc sec to 53 arc sec. The greatest gain in integrated intensity was obtained for 8-9 mm thickness where FWHM = 40 arc sec. If this crystal were used as a monochromator for synchrotron radiation, it would provide 40 times more intensity than a perfect silicon crystal and an energy bandwidth of 1 keV at 115 keV photon energy. With the increase of the rocking curve FWHM, a plateau across the peak maximum developed; its width increased from 5 arc sec to 25 arc sec when the crystal thickness increased from 5 mm to 12.5 mm, respectively. This plateau allows these crystals to be used as analyzer crystals in diffraction experiments, i.e., as very narrow slits to suppress background. A plateau width of about 5-20 arc sec for the analyzer crystal is needed to insure that the entire intensity scattered from a sample is delivered to the detector. The simple expedient of changing the crystal thickness alters the plateau width of the analyzer crystal and tunes its acceptance to the needs of the sample under study.",
author = "U. R{\"u}tt and Stock, {S. R.} and Rek, {Z. U.}",
year = "2001",
month = "12",
day = "1",
language = "English (US)",
volume = "678",
journal = "Materials Research Society Symposium - Proceedings",
issn = "0272-9172",
publisher = "Materials Research Society",

}

Study of TaSi2-Si crystals with high energy synchrotron radiation as tunable wide-bandpass monochromator and analyzer optics. / Rütt, U.; Stock, S. R.; Rek, Z. U.

In: Materials Research Society Symposium - Proceedings, Vol. 678, 01.12.2001.

Research output: Contribution to journalConference article

TY - JOUR

T1 - Study of TaSi2-Si crystals with high energy synchrotron radiation as tunable wide-bandpass monochromator and analyzer optics

AU - Rütt, U.

AU - Stock, S. R.

AU - Rek, Z. U.

PY - 2001/12/1

Y1 - 2001/12/1

N2 - Single crystals of the in situ composite TaSi2-Si are candidates for wide bandpass monochromators and analyzers for x-ray experiments. Two large crystals (32 × 39 × 7 mm3 and 32 × 39 × 30 mm3) were studied in detail using 115 keV synchrotron radiation at the BESSRC beamline at the APS. For transmission geometry, the Si(111) reflection and 39 mm crystal thickness, rocking curve widths of 95 arc sec with reflectivities of 50% were measured over the entire crystal. Turning the crystal to an angle of 45° to the incident beam and translating it through the beam allowed investigation of the influence of crystal thickness on diffracted intensity. For sample thicknesses ranging between 5 mm and 12.5 mm, the full width at half maximum (FWHM) of the rocking curve increased linearly from 29 arc sec to 53 arc sec. The greatest gain in integrated intensity was obtained for 8-9 mm thickness where FWHM = 40 arc sec. If this crystal were used as a monochromator for synchrotron radiation, it would provide 40 times more intensity than a perfect silicon crystal and an energy bandwidth of 1 keV at 115 keV photon energy. With the increase of the rocking curve FWHM, a plateau across the peak maximum developed; its width increased from 5 arc sec to 25 arc sec when the crystal thickness increased from 5 mm to 12.5 mm, respectively. This plateau allows these crystals to be used as analyzer crystals in diffraction experiments, i.e., as very narrow slits to suppress background. A plateau width of about 5-20 arc sec for the analyzer crystal is needed to insure that the entire intensity scattered from a sample is delivered to the detector. The simple expedient of changing the crystal thickness alters the plateau width of the analyzer crystal and tunes its acceptance to the needs of the sample under study.

AB - Single crystals of the in situ composite TaSi2-Si are candidates for wide bandpass monochromators and analyzers for x-ray experiments. Two large crystals (32 × 39 × 7 mm3 and 32 × 39 × 30 mm3) were studied in detail using 115 keV synchrotron radiation at the BESSRC beamline at the APS. For transmission geometry, the Si(111) reflection and 39 mm crystal thickness, rocking curve widths of 95 arc sec with reflectivities of 50% were measured over the entire crystal. Turning the crystal to an angle of 45° to the incident beam and translating it through the beam allowed investigation of the influence of crystal thickness on diffracted intensity. For sample thicknesses ranging between 5 mm and 12.5 mm, the full width at half maximum (FWHM) of the rocking curve increased linearly from 29 arc sec to 53 arc sec. The greatest gain in integrated intensity was obtained for 8-9 mm thickness where FWHM = 40 arc sec. If this crystal were used as a monochromator for synchrotron radiation, it would provide 40 times more intensity than a perfect silicon crystal and an energy bandwidth of 1 keV at 115 keV photon energy. With the increase of the rocking curve FWHM, a plateau across the peak maximum developed; its width increased from 5 arc sec to 25 arc sec when the crystal thickness increased from 5 mm to 12.5 mm, respectively. This plateau allows these crystals to be used as analyzer crystals in diffraction experiments, i.e., as very narrow slits to suppress background. A plateau width of about 5-20 arc sec for the analyzer crystal is needed to insure that the entire intensity scattered from a sample is delivered to the detector. The simple expedient of changing the crystal thickness alters the plateau width of the analyzer crystal and tunes its acceptance to the needs of the sample under study.

UR - http://www.scopus.com/inward/record.url?scp=18744434510&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=18744434510&partnerID=8YFLogxK

M3 - Conference article

VL - 678

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

SN - 0272-9172

ER -