Study of the surface adhesion of pressure-sensitive adhesives by atomic force microscopy and spherical indenter tests

Adriana Paiva, Nina Sheller, Mark D. Foster, Alfred J. Crosby, Kenneth R Shull

Research output: Contribution to journalArticlepeer-review

49 Scopus citations

Abstract

Atomic force microscopy allows observation of the adhesive surface and characterization of the adhesive behavior on a nanoscale level, providing new and important information about the behavior of pressure-sensitive adhesives (PSAs). In this research PSAs consisting of poly(ethylene propylene) and the n-butyl ester of abietic acid are studied. Results of nanoindentation measurements indicate two different types of behavior: a viscoelastic behavior in the tackifier-rich domains and a more highly dissipative response in the matrix with a gradual transition behavior in areas close to the interfaces between the domains and the matrix. The adhesive energy appears to be dictated predominantly by the tackifier-rich domains.

Original languageEnglish (US)
Pages (from-to)1878-1881
Number of pages4
JournalMacromolecules
Volume33
Issue number5
DOIs
StatePublished - Mar 7 2000

ASJC Scopus subject areas

  • Organic Chemistry
  • Polymers and Plastics
  • Inorganic Chemistry
  • Materials Chemistry

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