Scanning probe microscopy is now a well-developed imaging technique for both insulating and conducting surfaces. In fatigue and mechanical deformation studies, surfaces are usually rough. Hence, in order to obtain quantitative surface topographic information with minimal distortion, sharp tips and light loads must be used as well as the usual care to minimize thermal drift and vibrations. Among the techniques being used are scanning tunneling microscopy and its major variant, atomic force microscopy.
ASJC Scopus subject areas
- Materials Science(all)