Studying fatigue deformation using scanning probe microscopy

Beizhi Zhou, Yip-Wah Chung

Research output: Contribution to journalReview articlepeer-review

2 Scopus citations

Abstract

Scanning probe microscopy is now a well-developed imaging technique for both insulating and conducting surfaces. In fatigue and mechanical deformation studies, surfaces are usually rough. Hence, in order to obtain quantitative surface topographic information with minimal distortion, sharp tips and light loads must be used as well as the usual care to minimize thermal drift and vibrations. Among the techniques being used are scanning tunneling microscopy and its major variant, atomic force microscopy.

Original languageEnglish (US)
Pages (from-to)43-45
Number of pages3
JournalJOM
Volume49
Issue number7
DOIs
StatePublished - Jan 1 1997

ASJC Scopus subject areas

  • Materials Science(all)
  • Engineering(all)

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