Subband analysis and synthesis of real-world textures for objective and subjective determination of roughness

René Van Egmond*, Thrasyvoulos N. Pappas, Huib De Ridder

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations


In a previous study we investigated the roughness of real world textures taken from the CUReT database. We showed that people could systematically judge the subjective roughness of these textures. However, we did not determine which objective factors relate to these perceptual judgments of roughness. In the present study we take the first step in this direction using a subband decomposition of the CUReT textures. This subband decomposition is used to predict the subjective roughness judgments of the previous study. We also generated synthetic textures with uniformly distributed white noise of the same variance in each subband, and conducted a perceptual experiment to determine the perceived roughness of both the original and synthesized texture images. The participants were asked to rank-order the images based on the degree of perceived roughness. It was found that the synthesis method produces images that are similar in roughness to the original ones except for a small but systematic deviation.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE-IS and T Electronic Imaging - Human Vision and Electronic Imaging XV
StatePublished - 2010
EventHuman Vision and Electronic Imaging XV - San Jose, CA, United States
Duration: Jan 18 2010Jan 21 2010

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X


OtherHuman Vision and Electronic Imaging XV
CountryUnited States
CitySan Jose, CA


  • CUReT database
  • Roughness
  • Subband decomposition
  • Texture
  • Texture synthesis

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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