Subdiffraction-scale surface roughness impact upon spectroscopic microscopy detection of internal refractive index fluctuations: Applications to early-state cancer detection

Di Zhang, Ilker Capoglu, Lusik Cherkezyan, Hariharan Subramanian, Allen Taflove, Vadim Backman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Despite the fundamental diffraction limit of optical microscopy, we previously established that three-dimensional (3-D) subdiffraction-scale refractive-index (RI) fluctuations internal to a linear, label-free dielectric medium can be detected in the far zone with spectroscopic microscopy (Cherkezyan et al., PRL 111, 033903 (2013)). However, in our prior work, the air-medium interface was assumed to be a smooth plane.

Original languageEnglish (US)
Title of host publication2015 USNC-URSI Radio Science Meeting (Joint with AP-S Symposium), USNC-URSI 2015 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages1
ISBN (Electronic)9781479978175
DOIs
StatePublished - Oct 21 2015
EventUSNC-URSI Radio Science Meeting (Joint with AP-S Symposium), USNC-URSI 2015 - Vancouver, Canada
Duration: Jul 19 2015Jul 24 2015

Publication series

Name2015 USNC-URSI Radio Science Meeting (Joint with AP-S Symposium), USNC-URSI 2015 - Proceedings

Other

OtherUSNC-URSI Radio Science Meeting (Joint with AP-S Symposium), USNC-URSI 2015
CountryCanada
CityVancouver
Period7/19/157/24/15

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Communication

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