TY - GEN
T1 - Subdiffraction-scale surface roughness impact upon spectroscopic microscopy detection of internal refractive index fluctuations
T2 - USNC-URSI Radio Science Meeting (Joint with AP-S Symposium), USNC-URSI 2015
AU - Zhang, Di
AU - Capoglu, Ilker
AU - Cherkezyan, Lusik
AU - Subramanian, Hariharan
AU - Taflove, Allen
AU - Backman, Vadim
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/10/21
Y1 - 2015/10/21
N2 - Despite the fundamental diffraction limit of optical microscopy, we previously established that three-dimensional (3-D) subdiffraction-scale refractive-index (RI) fluctuations internal to a linear, label-free dielectric medium can be detected in the far zone with spectroscopic microscopy (Cherkezyan et al., PRL 111, 033903 (2013)). However, in our prior work, the air-medium interface was assumed to be a smooth plane.
AB - Despite the fundamental diffraction limit of optical microscopy, we previously established that three-dimensional (3-D) subdiffraction-scale refractive-index (RI) fluctuations internal to a linear, label-free dielectric medium can be detected in the far zone with spectroscopic microscopy (Cherkezyan et al., PRL 111, 033903 (2013)). However, in our prior work, the air-medium interface was assumed to be a smooth plane.
UR - http://www.scopus.com/inward/record.url?scp=84954227988&partnerID=8YFLogxK
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U2 - 10.1109/USNC-URSI.2015.7303486
DO - 10.1109/USNC-URSI.2015.7303486
M3 - Conference contribution
AN - SCOPUS:84954227988
T3 - 2015 USNC-URSI Radio Science Meeting (Joint with AP-S Symposium), USNC-URSI 2015 - Proceedings
SP - 202
BT - 2015 USNC-URSI Radio Science Meeting (Joint with AP-S Symposium), USNC-URSI 2015 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 19 July 2015 through 24 July 2015
ER -
