Subnanoscale characterization of lamellar interfaces in a complex TiAl Alloy

Stephan S.A. Gerstl*, Young Won Kim, David N. Seidman

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations
Original languageEnglish (US)
Pages (from-to)1096-1097
Number of pages2
JournalMicroscopy and Microanalysis
Volume8
Issue numberSUPPL. 2
DOIs
StatePublished - 2002

ASJC Scopus subject areas

  • Instrumentation

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