Subsurface imaging with widefield and confocal numerical aperture increasing lens microscopes

F. Hakan Köklü*, Y. Meydbray, Ernest R. Behringer, Justin I. Quesnel, D. Karabacak, Stephen B. Ippolito, Bennett B. Goldberg, M. Selim Ünlü

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

We obtain lateral spatial resolutions of 0.88 um and 0.29 um with custom infrared widefield and confocal numerical aperture increasing lens microscopes, respectively, when imaging subsurface structures. We discuss the relative advantages of each microscope.

Original languageEnglish (US)
Title of host publication19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages695-696
Number of pages2
ISBN (Print)0780395557, 9780780395558
DOIs
StatePublished - Jan 1 2006
Event19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS - Montreal, QC, Canada
Duration: Oct 29 2006Nov 2 2006

Publication series

NameConference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
ISSN (Print)1092-8081

Other

Other19th Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS
CountryCanada
CityMontreal, QC
Period10/29/0611/2/06

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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