Superconducting tunnel junction base electrode planarization

C. D. Thomas*, M. P. Ulmer, J. B. Ketterson

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

13 Scopus citations

Abstract

We have investigated the planarizing effects of multilayered superconducting thin films. Atomic force microscopy measurements indicate that coating a standard niobium base electrode with alternating layers of aluminum and niobium significantly reduces the film's overall surface roughness. Planarized films such as these were used as the base electrodes of superconducting tunnel junctions that show vastly improved leakage characteristics over conventional junctions fabricated under the same conditions.

Original languageEnglish (US)
Pages (from-to)364-367
Number of pages4
JournalJournal of Applied Physics
Volume84
Issue number1
DOIs
StatePublished - Jul 1 1998

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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